Refractive Index Resolved Imaging Enabled by Terahertz Time-Domain Spectroscopy Ellipsometry

被引：0

作者：

Alibeigloo, Pooya ^{[1
,2
]}

Kubiczek, Tobias ^{[2
]}

Aqlan, Basem ^{[2
]}

Damyanov, Dilyan ^{[2
,3
]}

Schultze, Thorsten ^{[2
]}

Weimann, Nils ^{[1
]}

Balzer, Jan C. ^{[2
]}

机构：

[1] Univ Duisburg Essen, Fac Engn, Dept Components High Frequency Elect BHE, D-47057 Duisburg, Germany

[2] Univ Duisburg Essen, Fac Engn, Chair Commun Syst NTS, D-47057 Duisburg, Germany

[3] Hensoldt Sensors GmbH, D-89044 Ulm, Germany

来源：

JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES | 2024年 / 45卷 / 11-12期

关键词：

Terahertz ellipsometry; Material characterization; Refractive index; Terahertz imaging; OPTICAL-CONSTANTS; THICKNESS;

D O I：

10.1007/s10762-024-01013-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Material characterization in the terahertz range is an interesting topic of research due to its great applications in material science, health monitoring, and security applications. Advances in terahertz generation, detection, and data acquisition have contributed to improved bandwidth, signal power, and signal-to-noise ratio. This enables advanced material characterization methods such as ellipsometry, which has been little explored in the terahertz frequency range, yet. Here, we introduce a comparison between material characterization with terahertz time-domain spectroscopy in transmission geometry and ellipsometry reflection geometry. Terahertz ellipsometry images were taken, showing spatially resolved refractive index estimation in the far field and higher image quality compared to single-polarization imaging.

引用

页码：984 / 998

页数：15

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