Relationship between dislocations and residual stresses in cold-drawn pearlitic steel analyzed by energy-dispersive X-ray diffraction

被引：34

作者：

Sato, Shigeo ^{[1
]}

Wagatsuma, Kazuaki ^{[1
]}

Suzuki, Shigeru ^{[2
]}

Kumagai, Masayoshi ^{[3
]}

Imafuku, Muneyuki ^{[3
]}

Tashiro, Hitoshi

Kajiwara, Kentaro ^{[4
]}

Shobu, Takahiasa ^{[5
]}

机构：

[1] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan

[2] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan

[3] Tokyo City Univ, Fac Engn, Tokyo 1588557, Japan

[4] Japan Synchrotron Radiat Res Inst, Sayo 6795198, Japan

[5] Japan Atom Energy Agcy, Sayo 6795184, Japan

来源：

MATERIALS CHARACTERIZATION | 2013年 / 83卷

基金：

日本学术振兴会;

关键词：

Energy dispersive X-ray diffraction; Line-profile analysis; Dislocation density; Residual stress; Pearlitic steel; LINE-PROFILE ANALYSIS; NEUTRON-DIFFRACTION; CEMENTITE; FERRITE; WIRE; POLYCRYSTALS; CONTRAST; SILICON; PHASES;

D O I：

10.1016/j.matchar.2013.06.017

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We analyzed the dislocation distribution of cold-drawn pearlitic-steel wire by using the line-profile analysis based on the energy dispersive X-ray diffraction (EDXD). Although this line-profile analysis requires a high resolution in reciprocal space, the resolution for EDXD is generally poor dire to the energy resolution of the detector. Our analysis demonstrated that the resolution in the reciprocal space can be maximized at small scattering angles. Using the line-profile analysis based on the EDXD, the microstructural parameters such as the crystallite size and the dislocation density of the ferrite phase in the pearlitic steel were successfully analyzed. In addition, the distribution of the residual stress of the ferrite phase of a pearlitic steel wire was also analyzed using the EDXD measurement. (C) 2013 Elsevier Inc. All rights reserved.

引用

页码：152 / 160

页数：9

共 26 条

[1] Influence of stacking-fault energy on microstructural characteristics of ultrafine-grain copper and copper-zinc alloys [J].

Balogh, Levente ;

Ungar, Tamas ;

Zhao, Yonghao ;

Zhu, Y. T. ;

Horita, Zenji ;

Xu, Cheng ;

Langdon, Terence G. .

ACTA MATERIALIA, 2008, 56 (04) :809-820

[2] USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING [J].

DEKEIJSER, TH ;

LANGFORD, JI ;

MITTEMEIJER, EJ ;

VOGELS, ABP .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) :308-314

[3] The spectral response of silicon X-ray detectors [J].

Eggert, T. ;

Boslau, O. ;

Kemmer, J. ;

Pahke, A. ;

Wiest, F. .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2006, 568 (01) :1-11

[4] Boundary strengthening in undeformed and deformed polycrystals [J].

Hansen, N .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2005, 409 (1-2) :39-45

[5] Neutron and X-ray diffraction study of residual and internal stress evolution in pearlitic steel during cold drawing [J].

Kriska, M. ;

Tacq, J. ;

Van Acker, K. ;

Seefeldt, M. ;

Van Petegem, S. .

5TH EUROPEAN CONFERENCE ON NEUTRON SCATTERING, 2012, 340

[6] BERECHNUNG DER ELASTISCHEN KONSTANTEN DES VIELKRISTALLS AUS DEN KONSTANTEN DES EINKRISTALLS [J].

KRONER, E .

ZEITSCHRIFT FUR PHYSIK, 1958, 151 (04) :504-518

[7] Evaluation of axial surface residual stress in 0.82-wt% carbon steel wire during multi-pass drawing process considering heat generation [J].

Lee, Sang-Kon ;

Kim, Dae-Woon ;

Jeong, Myeong-Sik ;

Kim, Byung-Min .

MATERIALS & DESIGN, 2012, 34 :363-371

[8] Stress effects on stability and diffusion of H in W: A first-principles study [J].

Li, Wen-Ying ;

Zhang, Ying ;

Zhou, Hong-Bo ;

Jin, Shuo ;

Lu, Guang-Hong .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2011, 269 (14) :1731-1734

[9] ELASTIC STIFFNESS COEFFICIENTS OF IRON FROM 77 DEGREES TO 673 DEGREES K [J].

LORD, AE ;

BESHERS, DN .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) :1620-&

[10] In situ X-ray multilayer reflectometry based on the energy dispersive method [J].

Malaurent, JC ;

Duval, H ;

Chauvineau, JP ;

Hainaut, O ;

Raynal, A ;

Dhez, P .

OPTICS COMMUNICATIONS, 2000, 173 (1-6) :255-263

← 1 2 3 →