High-mobility heterostructures based on InAs and InSb: A Monte Carlo study

被引:30
作者
Rodilla, H. [1 ]
Gonzalez, T. [1 ]
Pardo, D. [1 ]
Mateos, J. [1 ]
机构
[1] Univ Salamanca, Dept Fis Aplicada, E-37008 Salamanca, Spain
关键词
INAS/ALSB QUANTUM-WELLS; LOW-NOISE; COMPOUND SEMICONDUCTORS; TRANSPORT-PROPERTIES; POWER APPLICATIONS; IMPACT IONIZATION; HIGH-SPEED; HEMTS; PERFORMANCE; TRANSISTORS;
D O I
10.1063/1.3132863
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this work, by means of Monte Carlo simulations, two different narrow band gap semiconductors, InAs and InSb, and their associated heterostructures, AlSb/InAs and AlInSb/InSb, have been studied. The parameters for the bulk simulations have been optimized in order to correctly reproduce the experimental mobility values. For the correct simulation of the heterostructures, roughness scattering has been included in the model, and its strength has been adjusted to achieve a good agreement with the experimentally measured mobility. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3132863]
引用
收藏
页数:6
相关论文
共 37 条
  • [1] Antimonide-based compound semiconductors for electronic devices: A review
    Bennett, BR
    Magno, R
    Boos, JB
    Kruppa, W
    Ancona, MG
    [J]. SOLID-STATE ELECTRONICS, 2005, 49 (12) : 1875 - 1895
  • [2] BERGMAN J, 2003, P INT C IND PHOSPH R, P92503
  • [3] Determination of lattice parameters in the epitaxial AlSb/GaSb system by high resolution X-ray diffraction
    Bocchi, C
    Bosacchi, A
    Ferrari, C
    Franchi, S
    Franzosi, P
    Magnanini, R
    Nasi, L
    [J]. JOURNAL OF CRYSTAL GROWTH, 1996, 165 (1-2) : 8 - 14
  • [4] INTERFACE ROUGHNESS SCATTERING IN INAS/ALSB QUANTUM-WELLS
    BOLOGNESI, CR
    KROEMER, H
    ENGLISH, JH
    [J]. APPLIED PHYSICS LETTERS, 1992, 61 (02) : 213 - 215
  • [5] Impact ionization suppression by quantum confinement: Effects on the DC and microwave performance of narrow-gap channel InAs/AlSb HFET's
    Bolognesi, CR
    Dvorak, MW
    Chow, DH
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (05) : 826 - 832
  • [6] BRAR B, 2002, P IEEE LEST EASTM C, P92503
  • [7] HIGH-FIELD TRANSPORT IN GAAS, INP AND INAS
    BRENNAN, K
    HESS, K
    [J]. SOLID-STATE ELECTRONICS, 1984, 27 (04) : 347 - 357
  • [8] Investigation of impact ionization in InAs-channel HEMT ford high-speed and low-power applications
    Chang, Chia-Yuan
    Hsu, Heng-Tung
    Chang, Edward Yi
    Kuo, Chien-I
    Datta, Suman
    Radosavljevic, Marko
    Miyamoto, Yasuyuki
    Huang, Guo-Wei
    [J]. IEEE ELECTRON DEVICE LETTERS, 2007, 28 (10) : 856 - 858
  • [9] 0.1 μm In0.2Al0.8Sb-InAsHEMT low-noise amplifiers for ultralow-power applications
    Chou, Y. C.
    Lange, M. D.
    Bennett, B. R.
    Boos, J. B.
    Yang, J. M.
    Papanicolaou, N. A.
    Lin, C. H.
    Lee, L. J.
    Nam, P. S.
    Gutierrez, A. L.
    Farkas, D. S.
    Tsai, R. S.
    Wojtowicz, M.
    Chin, T. P.
    Oki, A. K.
    [J]. 2007 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2, 2007, : 617 - +
  • [10] MEASUREMENT OF THE HOT-ELECTRON CONDUCTIVITY IN SEMICONDUCTORS USING ULTRAFAST ELECTRIC PULSES
    DOBROVOLSKIS, Z
    GRIGORAS, K
    KROTKUS, A
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1989, 48 (03): : 245 - 249