Influence of Parasitic Capacitances and Inductances in a Power Electronic Converter on Junction Temperature of Power GaN HEMTs

被引:2
作者
Gorecki, Pawel [1 ]
Ahmed, Dennis [2 ]
机构
[1] Gdynia Maritime Univ, Dept Marine Elect, Gdynia, Poland
[2] Gdynia Maritime Univ, Fac Elect Engn, Gdynia, Poland
来源
2024 31ST INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEM, MIXDES 2024 | 2024年
关键词
GaN HEMT; temperature; parasitics; converter; power electronics;
D O I
10.23919/MIXDES62605.2024.10613973
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
GaN HEMTs are increasingly popular in power electronics applications. Their main advantage over other power semiconductor devices is low switching losses. However, it makes them also more sensitive to parasitic inductances and capacitances occurring in the circuit. They not only influence the waveforms of terminal currents and voltages by introducing overvoltages and overcurrents but also switching losses and, consequently, junction temperature. In the paper, the influence of parasitic elements occurring in the circuit on the junction temperature of GaN HEMTs operating in synchronous buck DC-DC converter is presented and discussed.
引用
收藏
页码:37 / 41
页数:5
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