Three-Dimensional Nanoscale Imaging of SiO2 Nanofiller in Styrene-Butadiene Rubber with High-Resolution and High-Sensitivity Ptychographic X-ray Computed Tomography

被引：2

作者：

Okawa, Naru ^{[1
,2
,3
]}

Ishiguro, Nozomu ^{[1
,3
]}

Takazawa, Shuntaro ^{[1
,2
,3
]}

Uematsu, Hideshi ^{[1
,2
,3
]}

Sasaki, Yuhei ^{[1
,2
,3
]}

Abe, Masaki ^{[1
,3
]}

Ozaki, Kyosuke ^{[3
]}

Honjo, Yoshiaki ^{[3
]}

Nishino, Haruki ^{[3
,4
]}

Joti, Yasumasa ^{[3
,4
]}

Hatsui, Takaki ^{[3
]}

Takahashi, Yukio ^{[1
,3
,5
,6
]}

机构：

[1] Tohoku Univ, Int Ctr Synchrotron Radiat Innovat Smart SRIS, 468-1 Aramaki Aza Aoba,Aoba Ku, Sendai 9808572, Japan

[2] Tohoku Univ, Grad Sch Engn, Dept Met, Aoba Yama 02,Aoba Ku, Sendai 9808579, Japan

[3] RIKEN SPring 8 Ctr, 1-1-1 Kouto,Sayo Cho, Sayo, Hyogo 6795148, Japan

[4] Japan Synchrotron Radiat Res Inst, 1-1-1 Kouto,Sayo Cho, Sayo, Hyogo 6795198, Japan

[5] Tohoku Univ, Inst Multidisciplinary Res Adv Mat IMRAM, 2-1-1 Katahira,Aoba Ku, Sendai 9808577, Japan

[6] Tohoku Univ, Inst Mat Res, 2-1-1 Katahira,Aoba Ku, Sendai 9808577, Japan

来源：

MICROSCOPY AND MICROANALYSIS | 2024年 / 30卷 / 05期

关键词：

CITIUS detector; computed tomography; ptychography; rubber materials; weak-phase objects; NATURAL-RUBBER; FILLER; DIFFRACTION; SILICA; RECONSTRUCTION; REINFORCEMENT; MICROSCOPY;

D O I：

10.1093/mam/ozae094

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

SiO2 aggregates in styrene-butadiene rubber (SBR) were observed using ptychographic X-ray computed tomography (PXCT). The rubber composites were illuminated with X-rays focused by total reflection focusing mirrors, and the ptychographic diffraction patterns were collected using a CITIUS detector in the range of -75 degrees to +75 degrees angle of incidence. The projection images of the rubber composites were reconstructed with a two-dimensional resolution of 76 nm, and no significant structural changes were observed during the PXCT measurements. A three-dimensional image of the rubber composite was reconstructed with an isotropic resolution of 98 nm. Segmentation of SiO2 from the SBR, based on a histogram analysis of the phase shift, revealed a fragmented network structure of interconnected SiO2 aggregates.

引用

页码：836 / 843

页数：8

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