Optimized Design of Trench Termination for High-Voltage β-Ga2O3 Trench MOS Barrier Schottky Diode with Anode Electrode Extension

被引:0
|
作者
Zhang, Shiyu [1 ]
Hu, Dongqing [1 ]
Zhou, Xintian [1 ]
Jia, Yunpeng [1 ]
Wu, Yu [1 ]
机构
[1] Beijing Univ Technol, Fac Informat Technol, Beijing, Peoples R China
关键词
beta-Ga2O3; Schottky barrier diode; Trench termination; Optimized design; Simulation;
D O I
10.1145/3650400.3650412
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
A trench termination with anode electrode extension structure for beta-Ga2O3 diode was designed and simulation studied. The simulation employed Sentaurus TCAD simulator. The influences of device's geometric parameters on the device's breakdown characteristics has been investigated. These geometric parameters include termination trench depth, anode electrode extension length, trench termination oxide layer thickness, and trench termination width. Optimization results was provided. The simulation results revealed an 88% increase in breakdown voltage for the optimized termination compared to the structure without terminations. Additionally, the termination efficiency approached almost 100%. Under the simulation condition, a 10 mu m increase in the trench termination width resulted in a 20% decrease in leakage current. All these results will provide valuable references for further research on beta-Ga2O3 trench barrier termination.
引用
收藏
页码:66 / 72
页数:7
相关论文
共 50 条
  • [1] Design and analysis of novel field plate-trench composite anode terminal in high-voltage Ga2O3 Schottky Barrier diode
    Wang, Ying
    Zhang, Xiao-bei
    Guan, He
    Gan, Xue-tao
    PHYSICA SCRIPTA, 2025, 100 (02)
  • [2] 3.4 kV Breakdown Voltage Ga2O3 Trench Schottky Diode with Optimized Trench Corner Radius
    Huang, Xuan
    Liao, Fei
    Li, Ling
    Liang, Xiao
    Liu, Qiang
    Zhang, Chaoqun
    Hu, Xintong
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2020, 9 (04)
  • [3] 3.4 kV Breakdown Voltage Ga2O3 Trench Schottky Diode with Optimized Trench Corner Radius
    Huang, Xuan
    Liao, Fei
    Li, Ling
    Liang, Xiao
    Liu, Qiang
    Zhang, Chaoqun
    Hu, Xintong
    ECS Journal of Solid State Science and Technology, 2020, 9 (04):
  • [4] Fast Recovery Performance of β-Ga2O3 Trench MOS Schottky Barrier Diodes
    Takatsuka, Akio
    Sasaki, Kohei
    Wakimoto, Daiki
    Quang Tu Thieu
    Koishikawa, Yuki
    Arima, Jun
    Hirabayashi, Jun
    Inokuchi, Daisuke
    Fukumitsu, Yoshiaki
    Kuramata, Akito
    Yamakoshi, Shigenobu
    2018 76TH DEVICE RESEARCH CONFERENCE (DRC), 2018,
  • [5] Demonstration of Ga2O3 Trench MOS-Type Schottky Barrier Diodes
    Sasaki, K.
    Wakimoto, D.
    Thieu, Q. T.
    Koishikawa, Y.
    Kuramata, A.
    Higashiwaki, M.
    Yamakoshi, S.
    2017 75TH ANNUAL DEVICE RESEARCH CONFERENCE (DRC), 2017,
  • [6] Design and optimizing of trench Schottky barrier-controlled ?-Ga2O3 Schottky diode with low turn-on voltage and leakage current
    Shen, Yisong
    Zhang, Qihao
    Xiao, Kai
    Xia, Ning
    Zhang, Hui
    Zhai, Dongyuan
    He, Min
    Liu, Jiangwei
    Lu, Jiwu
    MICRO AND NANOSTRUCTURES, 2022, 168
  • [7] Packaged β-Ga2O3 Trench MOS Schottky Diode With Nearly Ideal Junction Properties
    Wilhelmi, Florian
    Kunori, Shinji
    Sasaki, Kohei
    Kuramata, Akito
    Komatsu, Yuji
    Lindemann, Andreas
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2022, 37 (04) : 3737 - 3742
  • [8] Breakdown Mechanisms in β-Ga2O3 Trench-MOS Schottky-Barrier Diodes
    Moule, Taylor
    Dalcanale, Stefano
    Kumar, Akhil S.
    Uren, Michael J.
    Li, Wenshen
    Nomoto, Kazuki
    Jena, Debdeep
    Xing, Huili Grace
    Kuball, Martin
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (01) : 75 - 81
  • [9] First Demonstration of Ga2O3 Trench MOS-Type Schottky Barrier Diodes
    Sasaki, Kohei
    Wakimoto, Daiki
    Thieu, Quang Tu
    Koishikawa, Yuki
    Kuramata, Akito
    Higashiwaki, Masataka
    Yamakoshi, Shigenobu
    IEEE ELECTRON DEVICE LETTERS, 2017, 38 (06) : 783 - 785
  • [10] High-Voltage -Ga2O3 Schottky Diode with Argon-Implanted Edge Termination
    Gao, Yangyang
    Li, Ang
    Feng, Qian
    Hu, Zhuangzhuang
    Feng, Zhaoqing
    Zhang, Ke
    Lu, Xiaoli
    Zhang, Chunfu
    Zhou, Hong
    Mu, Wenxiang
    Jia, Zhitai
    Zhang, Jincheng
    Hao, Yue
    NANOSCALE RESEARCH LETTERS, 2019, 14 (1):