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- [1] Design and analysis of novel field plate-trench composite anode terminal in high-voltage Ga2O3 Schottky Barrier diodePHYSICA SCRIPTA, 2025, 100 (02)Wang, Ying论文数: 0 引用数: 0 h-index: 0机构: Northwestern Polytech Univ, Dept Microelect, 1 Dongxiang Rd,Chang Dist, Xian 710129, Shaanxi, Peoples R China Northwestern Polytech Univ, Dept Microelect, 1 Dongxiang Rd,Chang Dist, Xian 710129, Shaanxi, Peoples R ChinaZhang, Xiao-bei论文数: 0 引用数: 0 h-index: 0机构: Northwestern Polytech Univ, Dept Microelect, 1 Dongxiang Rd,Chang Dist, Xian 710129, Shaanxi, Peoples R China Northwestern Polytech Univ, Dept Microelect, 1 Dongxiang Rd,Chang Dist, Xian 710129, Shaanxi, Peoples R ChinaGuan, He论文数: 0 引用数: 0 h-index: 0机构: Northwestern Polytech Univ, Dept Microelect, 1 Dongxiang Rd,Chang Dist, Xian 710129, Shaanxi, Peoples R China Northwestern Polytech Univ, Dept Microelect, 1 Dongxiang Rd,Chang Dist, Xian 710129, Shaanxi, Peoples R ChinaGan, Xue-tao论文数: 0 引用数: 0 h-index: 0机构: Northwestern Polytech Univ, Dept Microelect, 1 Dongxiang Rd,Chang Dist, Xian 710129, Shaanxi, Peoples R China Northwestern Polytech Univ, Dept Microelect, 1 Dongxiang Rd,Chang Dist, Xian 710129, Shaanxi, Peoples R China
- [2] 3.4 kV Breakdown Voltage Ga2O3 Trench Schottky Diode with Optimized Trench Corner RadiusECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2020, 9 (04)Huang, Xuan论文数: 0 引用数: 0 h-index: 0机构: Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R China Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R ChinaLiao, Fei论文数: 0 引用数: 0 h-index: 0机构: Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R China Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R ChinaLi, Ling论文数: 0 引用数: 0 h-index: 0机构: Chongqing Univ Technol, Sch Mat Sci & Engn, Chongqing 400054, Peoples R China Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R ChinaLiang, Xiao论文数: 0 引用数: 0 h-index: 0机构: Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R China Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R ChinaLiu, Qiang论文数: 0 引用数: 0 h-index: 0机构: Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R China Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R ChinaZhang, Chaoqun论文数: 0 引用数: 0 h-index: 0机构: Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R China Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R ChinaHu, Xintong论文数: 0 引用数: 0 h-index: 0机构: Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R China Chongqing Univ Technol, Coll Sci, Chongqing 400054, Peoples R China
- [3] 3.4 kV Breakdown Voltage Ga2O3 Trench Schottky Diode with Optimized Trench Corner RadiusECS Journal of Solid State Science and Technology, 2020, 9 (04):Huang, Xuan论文数: 0 引用数: 0 h-index: 0机构: College of Science, Chongqing University of Technology, Chongqing,400054, China College of Science, Chongqing University of Technology, Chongqing,400054, ChinaLiao, Fei论文数: 0 引用数: 0 h-index: 0机构: College of Science, Chongqing University of Technology, Chongqing,400054, China College of Science, Chongqing University of Technology, Chongqing,400054, ChinaLi, Ling论文数: 0 引用数: 0 h-index: 0机构: School of Materials Science and Engineering, Chongqing University of Technology, Chongqing,400054, China College of Science, Chongqing University of Technology, Chongqing,400054, ChinaLiang, Xiao论文数: 0 引用数: 0 h-index: 0机构: College of Science, Chongqing University of Technology, Chongqing,400054, China College of Science, Chongqing University of Technology, Chongqing,400054, ChinaLiu, Qiang论文数: 0 引用数: 0 h-index: 0机构: College of Science, Chongqing University of Technology, Chongqing,400054, China College of Science, Chongqing University of Technology, Chongqing,400054, ChinaZhang, Chaoqun论文数: 0 引用数: 0 h-index: 0机构: College of Science, Chongqing University of Technology, Chongqing,400054, China College of Science, Chongqing University of Technology, Chongqing,400054, ChinaHu, Xintong论文数: 0 引用数: 0 h-index: 0机构: College of Science, Chongqing University of Technology, Chongqing,400054, China College of Science, Chongqing University of Technology, Chongqing,400054, China
- [4] Fast Recovery Performance of β-Ga2O3 Trench MOS Schottky Barrier Diodes2018 76TH DEVICE RESEARCH CONFERENCE (DRC), 2018,Takatsuka, Akio论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanSasaki, Kohei论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Tamura Corp, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanWakimoto, Daiki论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Tamura Corp, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanQuang Tu Thieu论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanKoishikawa, Yuki论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Tamura Corp, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanArima, Jun论文数: 0 引用数: 0 h-index: 0机构: TDK Corp, 2-15-7 Higashi Ohwada, Ichikawa, Chiba 2728558, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanHirabayashi, Jun论文数: 0 引用数: 0 h-index: 0机构: TDK Corp, 2-15-7 Higashi Ohwada, Ichikawa, Chiba 2728558, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanInokuchi, Daisuke论文数: 0 引用数: 0 h-index: 0机构: TDK Corp, 2-15-7 Higashi Ohwada, Ichikawa, Chiba 2728558, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanFukumitsu, Yoshiaki论文数: 0 引用数: 0 h-index: 0机构: TDK Corp, 2-15-7 Higashi Ohwada, Ichikawa, Chiba 2728558, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanKuramata, Akito论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Tamura Corp, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, JapanYamakoshi, Shigenobu论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Tamura Corp, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Novel Crystal Technol Inc, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan
- [5] Demonstration of Ga2O3 Trench MOS-Type Schottky Barrier Diodes2017 75TH ANNUAL DEVICE RESEARCH CONFERENCE (DRC), 2017,Sasaki, K.论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol, Sayama, Saitama 3501328, Japan Tamura Corp, Sayama, Saitama 3501328, Japan Novel Crystal Technol, Sayama, Saitama 3501328, JapanWakimoto, D.论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol, Sayama, Saitama 3501328, Japan Tamura Corp, Sayama, Saitama 3501328, Japan Novel Crystal Technol, Sayama, Saitama 3501328, JapanThieu, Q. T.论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol, Sayama, Saitama 3501328, Japan Novel Crystal Technol, Sayama, Saitama 3501328, JapanKoishikawa, Y.论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol, Sayama, Saitama 3501328, Japan Tamura Corp, Sayama, Saitama 3501328, Japan Novel Crystal Technol, Sayama, Saitama 3501328, JapanKuramata, A.论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol, Sayama, Saitama 3501328, Japan Tamura Corp, Sayama, Saitama 3501328, Japan Novel Crystal Technol, Sayama, Saitama 3501328, JapanHigashiwaki, M.论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan Novel Crystal Technol, Sayama, Saitama 3501328, JapanYamakoshi, S.论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol, Sayama, Saitama 3501328, Japan Tamura Corp, Sayama, Saitama 3501328, Japan Novel Crystal Technol, Sayama, Saitama 3501328, Japan
- [6] Design and optimizing of trench Schottky barrier-controlled ?-Ga2O3 Schottky diode with low turn-on voltage and leakage currentMICRO AND NANOSTRUCTURES, 2022, 168Shen, Yisong论文数: 0 引用数: 0 h-index: 0机构: Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R ChinaZhang, Qihao论文数: 0 引用数: 0 h-index: 0机构: Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R ChinaXiao, Kai论文数: 0 引用数: 0 h-index: 0机构: China Southern Power Grid Extra High Voltage Powe, Maintenance Test Ctr, Guangzhou 510000, Guangdong, Peoples R China Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R ChinaXia, Ning论文数: 0 引用数: 0 h-index: 0机构: Zhejiang Univ, Inst Adv Semicond, Hangzhou 311200, Zhejiang, Peoples R China Zhejiang Univ, Hangzhou Innovat Ctr, Zhejiang Prov Key Lab Power Semicond Mat & Device, Hangzhou 311200, Zhejiang, Peoples R China Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R ChinaZhang, Hui论文数: 0 引用数: 0 h-index: 0机构: Zhejiang Univ, Inst Adv Semicond, Hangzhou 311200, Zhejiang, Peoples R China Zhejiang Univ, Hangzhou Innovat Ctr, Zhejiang Prov Key Lab Power Semicond Mat & Device, Hangzhou 311200, Zhejiang, Peoples R China Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R ChinaZhai, Dongyuan论文数: 0 引用数: 0 h-index: 0机构: Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R ChinaHe, Min论文数: 0 引用数: 0 h-index: 0机构: Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R ChinaLiu, Jiangwei论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Mat Sci, Res Ctr Funct Mat, Tsukuba, Ibaraki 3050044, Japan Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R ChinaLu, Jiwu论文数: 0 引用数: 0 h-index: 0机构: Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China
- [7] Packaged β-Ga2O3 Trench MOS Schottky Diode With Nearly Ideal Junction PropertiesIEEE TRANSACTIONS ON POWER ELECTRONICS, 2022, 37 (04) : 3737 - 3742Wilhelmi, Florian论文数: 0 引用数: 0 h-index: 0机构: Otto von Guericke Univ, Chair Power Elect, D-39106 Magdeburg, Germany Otto von Guericke Univ, Chair Power Elect, D-39106 Magdeburg, GermanyKunori, Shinji论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Otto von Guericke Univ, Chair Power Elect, D-39106 Magdeburg, GermanySasaki, Kohei论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Otto von Guericke Univ, Chair Power Elect, D-39106 Magdeburg, GermanyKuramata, Akito论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Otto von Guericke Univ, Chair Power Elect, D-39106 Magdeburg, GermanyKomatsu, Yuji论文数: 0 引用数: 0 h-index: 0机构: ZF Japan Co Ltd, Yokohama, Kanagawa 2310801, Japan Otto von Guericke Univ, Chair Power Elect, D-39106 Magdeburg, GermanyLindemann, Andreas论文数: 0 引用数: 0 h-index: 0机构: Otto von Guericke Univ, Chair Power Elect, D-39106 Magdeburg, Germany Otto von Guericke Univ, Chair Power Elect, D-39106 Magdeburg, Germany
- [8] Breakdown Mechanisms in β-Ga2O3 Trench-MOS Schottky-Barrier DiodesIEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (01) : 75 - 81Moule, Taylor论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandDalcanale, Stefano论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandKumar, Akhil S.论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandUren, Michael J.论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandLi, Wenshen论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandNomoto, Kazuki论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandJena, Debdeep论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Sch Elect & Comp Engn, Dept Mat Sci & Engn, Ithaca, NY 14853 USA Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandXing, Huili Grace论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Sch Elect & Comp Engn, Dept Mat Sci & Engn, Ithaca, NY 14853 USA Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, EnglandKuball, Martin论文数: 0 引用数: 0 h-index: 0机构: Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England Univ Bristol, Ctr Device Thermog & Reliabil, Bristol BS8 1TL, Avon, England
- [9] First Demonstration of Ga2O3 Trench MOS-Type Schottky Barrier DiodesIEEE ELECTRON DEVICE LETTERS, 2017, 38 (06) : 783 - 785Sasaki, Kohei论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Tamura Corp, Sayama, Osaka 3501328, Japan Novel Crystal Technol Inc, Sayama, Osaka 3501328, JapanWakimoto, Daiki论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Tamura Corp, Sayama, Osaka 3501328, Japan Novel Crystal Technol Inc, Sayama, Osaka 3501328, JapanThieu, Quang Tu论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Novel Crystal Technol Inc, Sayama, Osaka 3501328, JapanKoishikawa, Yuki论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Tamura Corp, Sayama, Osaka 3501328, Japan Novel Crystal Technol Inc, Sayama, Osaka 3501328, JapanKuramata, Akito论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Tamura Corp, Sayama, Osaka 3501328, Japan Novel Crystal Technol Inc, Sayama, Osaka 3501328, JapanHigashiwaki, Masataka论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Informat & Commun Technol, Tokyo 1848795, Japan Novel Crystal Technol Inc, Sayama, Osaka 3501328, JapanYamakoshi, Shigenobu论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Tamura Corp, Sayama, Osaka 3501328, Japan Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan
- [10] High-Voltage -Ga2O3 Schottky Diode with Argon-Implanted Edge TerminationNANOSCALE RESEARCH LETTERS, 2019, 14 (1):Gao, Yangyang论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaLi, Ang论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaFeng, Qian论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaHu, Zhuangzhuang论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaFeng, Zhaoqing论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaZhang, Ke论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaLu, Xiaoli论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaZhang, Chunfu论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaZhou, Hong论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaMu, Wenxiang论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Key Lab Funct Crystal Mat & Device, State Key Lab Crystal Mat, Jinan 250100, Shandong, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaJia, Zhitai论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Key Lab Funct Crystal Mat & Device, State Key Lab Crystal Mat, Jinan 250100, Shandong, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaZhang, Jincheng论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R ChinaHao, Yue论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Bandgap Semicond Te, Xian 710071, Shaanxi, Peoples R China