Binding energy referencing in X-ray photoelectron spectroscopy: Expanded data set confirms that adventitious carbon aligns to the sample vacuum level

被引:80
作者
Greczynski, Grzegorz [1 ]
机构
[1] Linkoping Univ, Dept Phys IFM, Thin Film Phys Div, SE-58183 Linkoping, Sweden
关键词
XPS; Surface chemistry; Adventitious carbon; Binding energy reference; work function; ELECTRON RELAXATION ENERGIES; VALENCE-BAND FORMATION; LINEAR ALKANES; WORK-FUNCTION; GAS-PHASE; XPS; SPECTRA; CALIBRATION; CATALYSTS; METAL;
D O I
10.1016/j.apsusc.2024.160666
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The correct referencing of the binding energy scale is essential for the accuracy of chemical analysis by X-ray photoelectron spectroscopy. The C 1s C-C/C-H peak from adventitious carbon (AdC), most commonly used for that purpose, was previously shown to shift by several eVs following changes in the sample work function phi SA , thus indicating that AdC aligns to the sample vacuum level (VL). Here, results from a much larger sample set including 360 specimens comprising metals, nitrides, carbides, borides, oxides, carbonitrides, and oxynitrides are presented. Irrespective of the material system the C 1s peak of AdC is found to follow changes in phi SA fully confirming previous results. Several observations exclude differential charging as plausible explanation for the C 1s peak shifts. All experimental evidence points instead to the VL alignment at the AdC/sample interface as the main reason. Should the C 1s peak of AdC be used for spectra referencing the measurement of sample work function is necessary, irrespective of whether samples are measured grounded or insulated from the spectrometer.
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页数:5
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共 51 条
[11]   BIASED REFERENCING EXPERIMENTS FOR THE XPS ANALYSIS OF NONCONDUCTING MATERIALS [J].
EDGELL, MJ ;
BAER, DR ;
CASTLE, JE .
APPLIED SURFACE SCIENCE, 1986, 26 (02) :129-149
[12]   Referencing to adventitious carbon in X-ray photoelectron spectroscopy: Can differential charging explain C 1s peak shifts? [J].
Greczynski, G. ;
Hultman, L. .
APPLIED SURFACE SCIENCE, 2022, 606
[13]   The same chemical state of carbon gives rise to two peaks in X-ray photoelectron spectroscopy [J].
Greczynski, G. ;
Hultman, L. .
SCIENTIFIC REPORTS, 2021, 11 (01)
[14]   X-ray photoelectron spectroscopy: Towards reliable binding energy referencing [J].
Greczynski, G. ;
Hultman, L. .
PROGRESS IN MATERIALS SCIENCE, 2020, 107
[15]   Reliable determination of chemical state in x-ray photoelectron spectroscopy based on sample-work-function referencing to adventitious carbon: Resolving the myth of apparent constant binding energy of the C 1s peak [J].
Greczynski, G. ;
Hultman, L. .
APPLIED SURFACE SCIENCE, 2018, 451 :99-103
[16]   In-situ observation of self-cleansing phenomena during ultra-high vacuum anneal of transition metal nitride thin films: Prospects for non-destructive photoelectron spectroscopy [J].
Greczynski, G. ;
Hultman, L. .
APPLIED PHYSICS LETTERS, 2016, 109 (21)
[17]   Self-consistent modelling of X-ray photoelectron spectra from air-exposed polycrystalline TiN thin films [J].
Greczynski, G. ;
Hultman, L. .
APPLIED SURFACE SCIENCE, 2016, 387 :294-300
[18]   Venting temperature determines surface chemistry of magnetron sputtered TiN films [J].
Greczynski, G. ;
Mraz, S. ;
Hultman, L. ;
Schneider, J. M. .
APPLIED PHYSICS LETTERS, 2016, 108 (04)
[19]   Toward an increased reliability of chemical bonding assignment in insulating samples by x-ray photoelectron spectroscopy [J].
Greczynski, Grzegorz ;
Pshyk, Oleksandr ;
Hultman, Lars .
SCIENCE ADVANCES, 2023, 9 (37)
[20]   C1s Peak of Adventitious Carbon Aligns to the Vacuum Level: Dire Consequences for Material's Bonding Assignment by Photoelectron Spectroscopy [J].
Greczynski, Grzegorz ;
Hultman, Lars .
CHEMPHYSCHEM, 2017, 18 (12) :1507-1512