Heteroepitaxial growth of Ga2O3 thin films on nickel-nanodot-induced buffer layers for solar-blind ultraviolet photodetector applications

被引:4
作者
Bae, Si -Young [1 ]
Kim, Dong-Eun [1 ,2 ]
Kong, Min -Sung [2 ]
Kim, Seokgi [3 ]
Hong, Yunhwa [3 ]
Heo, Kwang [3 ]
Kim, Sungkyu [3 ]
Park, Min-Su [2 ]
机构
[1] Korea Inst Ceram Engn & Technol, Semicond Mat Ctr, Jinju 52851, South Korea
[2] Dong A Univ, Dept Elect Engn, Busan 49315, South Korea
[3] Sejong Univ, Dept Nanotechnol & Adv Mat Engn, Seoul 05006, South Korea
基金
新加坡国家研究基金会;
关键词
Ga2O3 thin film; Ni nanodot; Mist CVD; Mixed polymorphs; UV photodetector; GALLIUM-OXIDE; SAPPHIRE; ALPHA; MOCVD;
D O I
10.1016/j.jallcom.2024.174811
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Heteroepitaxial growth of gallium oxide (Ga2O3) thin films has been conducted on nickel (Ni)-nanodot-induced buffer layers using a mist chemical vapor deposition. The separation degree and droplet size of the Ni nanodots on sapphire substrates were controlled through a thermal annealing process, thereby being used as templates for the Ga2O3 thin-film growth. The growth of the inverted cone-shaped epsilon-Ga2O3 polymorph was observed on the nanodots while the alpha-Ga2O3 polymorph was grown on the sapphire substrate without nanodots, ultimately a thin film with a mixture of epsilon and alpha polymorphs can be achieved. By comparing photoresponses of metal-semiconductor-metal photodetectors fabricated on the thin film with the mixed polymorphs and on a single-crystalline alpha-Ga2O3 film, a promising template for using solar-blind photo-detecting applications has been verified.
引用
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页数:8
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