Atomic-scale stick-slip through a point defect

被引:0
|
作者
Gnecco, Enrico [1 ]
Nicolini, Paolo [2 ]
机构
[1] Jagiellonian Univ, Marian Smoluchowski Inst Phys, PL-30348 Krakow, Poland
[2] Czech Acad Sci, Inst Phys FZU, Na Slovance 2, Prague 18200, Czech Republic
关键词
FRICTION; GRAPHENE;
D O I
10.1103/PhysRevB.109.134103
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have derived a series of analytical formulas describing the motion of a nanotip elastically driven across a Gaussian potential well of depth U-1 and half width sigma. The tip gets pinned if the impact parameter y(0) is below a well-defined threshold value. Together with U-1 and sigma , this value determines the pinning force. The scenario is slightly modified by superimposing a periodic potential with amplitude U-0 in the background, provided that U-0 << U-1. The formulas presented here can be applied to estimate the pinning energy and the linear extension of the perturbation created by a point defect such as an atomic vacancy on a crystal surface from atomic-scale friction force measurements performed by scanning probe microscopy.
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页数:6
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