The class of log-symmetric distributions is a generalization of log-normal distribution and includes some well-known distributions such as log-normal, log-logistic, log-Laplace, log-Cauchy, log-power-exponential, log-student-t, log-slash, and Birnbaum-Saunders distributions. In this paper, several characterization results are obtained for log-symmetric distributions based on moments of some functions of the parent distribution and also on the basis of some properties of order statistics. Specifically, when X is identical in distribution with a decreasing continuous function $ h(X) $ h(X), then a relationship is established between upper and lower order statistics which is then utilized to construct characterization results for log-symmetric distributions in terms of functions of order statistics. The established results can be used for constructing a goodness-of-fit test for log-symmetric distributions.
机构:
North West Univ, Sch Math & Stat Sci, Potchefstroom Campus, ZA-2531 Potchefstroom, South AfricaKarlsruhe Inst Technol KIT, Inst Stochast, Karlsruhe, Germany
Liebenberg, S. C.
;
Visagie, I. J. H.
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机构:
North West Univ, Sch Math & Stat Sci, Potchefstroom Campus, ZA-2531 Potchefstroom, South AfricaKarlsruhe Inst Technol KIT, Inst Stochast, Karlsruhe, Germany
机构:
North West Univ, Sch Math & Stat Sci, Potchefstroom Campus, ZA-2531 Potchefstroom, South AfricaKarlsruhe Inst Technol KIT, Inst Stochast, Karlsruhe, Germany
Liebenberg, S. C.
;
Visagie, I. J. H.
论文数: 0引用数: 0
h-index: 0
机构:
North West Univ, Sch Math & Stat Sci, Potchefstroom Campus, ZA-2531 Potchefstroom, South AfricaKarlsruhe Inst Technol KIT, Inst Stochast, Karlsruhe, Germany