High-Sensitivity Visualization of Ultrafast Carrier Diffusion by Wide-Field Holographic Microscopy

Ultrafast transient microscopy is a key tool to study the photophysical properties of materials in space and time, but current implementations are limited to approximate to 1-mu m fields of view, offering no statistical information for heterogeneous samples. Recently, we demonstrated wide-field transient imaging based on multiplexed off-axis holography. Here, we perform ultrafast microscopy in parallel around a hundred diffraction-limited excitation spots over a approximate to 60-mu m field of view, which not only automatically samples the photophysical heterogeneity of the sample over a large area but can also be used to obtain a 10-fold increase in signal-tonoise ratio by computing an average spot. We apply our microscope to study the carrier diffusion processes in methylammonium lead bromide perovskites. We observe strong diffusion due to the presence of hot carriers during the first picosecond and slower diffusion afterward. We also describe how many-body kinetics can be misleadingly interpreted as strong diffusion at high excitation densities, while at weak excitation, real diffusion is observed. Therefore, the vast increase in sensitivity offered by this technique benefits the study of carrier transport not only by reducing data acquisition times but also by enabling the measurement of the much smaller signals generated at low carrier densities.