Memristive devices for metrological applications

被引：1

作者：

Cabral, Vitor ^{[1
]}

Cultrera, Alessandro ^{[2
]}

Chen, Shaochuan ^{[4
]}

Pereira, Joao ^{[6
]}

Ribeiro, Luis ^{[1
]}

Godinho, Isabel ^{[1
]}

Boarino, Luca

De Leo, Natascia ^{[3
]}

Callegaro, Luca ^{[2
]}

Cardoso, Susana

Valov, Ilia ^{[4
,5
]}

Milano, Gianluca ^{[3
]}

机构：

[1] Inst Portugues Qualidade, Rua Antonio Giao 2, P-2829513 Caparica, Portugal

[2] Ist Nazl Ric Metrolog Quantum Metrol & Nanotechnol, Str Cacce 91, I-10135 Turin, Torino, Italy

[3] Ist Nazl Ric Metrolog Adv Mat, Life Sci Div, Str Cacce 91, I-10135 Turin, Torino, Italy

[4] Rhein Westfal TH Aachen, IWE2, Sommerfeldstr 24, D-52074 Aachen, Germany

[5] Res Ctr Juelich, PGI-7,Wilhelm Johnen Str, D-52425 Julich, Germany

[6] INESC Microsistemas & Nanotecnol, Rua Alves Redol 9, P-1000029 Lisbon, Portugal

来源：

ACTA IMEKO | 2023年 / 12卷 / 03期

关键词：

Memristive; quantum conductance; quantum resistance; nanometrology;

D O I：

10.21014/actaimeko.v12i3.1450

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The EMPIR project 20FUN06 MEMQuD- "Memristive devices as quantum standard for nanometrology" has as one of its fundamental goals the development of technical capability and scientific knowledge for the implementation of a quantum resistance standard based on memristive devices characterized by high scalability down to the nanometer scale, compatibility with CMOS, complementary metal- oxide semiconductor, and working in air at room temperature. In this work it is presented an overview of the project, highlighted relevant characteristics and working principles of memristive devices and potential applications with focus on metrological application with framing allowed by the last revision of the International System of Units SI that is the motivation and background for the aim of this project.

引用

页码：1 / 5

页数：5

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