Far-Field Super-Resolution Microscopy Using Evanescent Illumination: A Review

被引：0
作者：
Zhang, Qianwei [1 ]
Zhang, Haonan [1 ]
Yang, Xiaoyu [1 ]
Liu, Xu [1 ,2 ,3 ]
Tang, Mingwei [1 ]
Yang, Qing [1 ,2 ,3 ,4 ]
机构：
[1] Zhejiang Univ, Coll Opt Sci & Engn, Int Res Ctr Adv Photon, State Key Lab Extreme Photon & Instrumentat, Hangzhou 310027, Peoples R China
[2] Zhejiang Univ, Hangzhou Global Sci & Technol Innovat Ctr, ZJU, Hangzhou 311215, Peoples R China
[3] Shanxi Univ, Collaborat Innovat Ctr Extreme Opt, Taiyuan 030006, Peoples R China
[4] Zhejiang Univ, Coll Chem & Biol Engn, Key Lab Smart Biomat Zhejiang Prov, Hangzhou 310027, Peoples R China
来源：
PHOTONICS | 2024年 / 11卷 / 06期
基金：
中国国家自然科学基金;
关键词：
far-field microscopy; super-resolution; evanescent illumination; spatial frequency shift; REFLECTION FLUORESCENCE MICROSCOPY; WIDE-FIELD; SUBDIFFRACTION-RESOLUTION; DIFFRACTION LIMIT; SINGLE MOLECULES; RECONSTRUCTION; MICROSPHERES;
D O I：
10.3390/photonics11060528
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The resolution of conventional optical microscopy is restricted by the diffraction limit. Light waves containing higher-frequency information about the sample are bound to the sample surface and cannot be collected by far-field optical microscopy. To break the resolution limit, researchers have proposed various far-field super-resolution (SR) microscopy imaging methods using evanescent waves to transfer the high-frequency information of samples to the low-frequency passband of optical microscopy. Optimization algorithms are developed to reconstruct a SR image of the sample by utilizing the high-frequency information. These techniques can be collectively referred to as spatial-frequency-shift (SFS) SR microscopy. This review aims to summarize the basic principle of SR microscopy using evanescent illumination and introduce the advances in this research area. Some current challenges and possible directions are also discussed.
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页数：17
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