Parametric and Catastrophic Failures of Metallized Film Capacitors Under High Voltage Stress

被引：3

作者：

Ivanov, Ivan O. ^{[1
]}

Glivenko, Dmitry Y. ^{[2
]}

Hojamov, Ahmet A. ^{[1
]}

Pechnikov, Alexey V. ^{[1
]}

机构：

[1] Peter Great St Petersburg Polytech Univ, Higher Sch High Voltage Engn, St Petersburg 195251, Russia

[2] GIRICOND, Res Inst, St Petersburg 194223, Russia

来源：

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS | 2024年 / 60卷 / 01期

基金：

俄罗斯科学基金会;

关键词：

Capacitors; Capacitance; Metallization; Software; Dielectric losses; Voltage measurement; Testing; High voltage stress; metallized film capacitors; parametric and catastrophic failures; ramp voltage test; self-healing effect;

D O I：

10.1109/TIA.2023.3327994

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Operation ability of different metallized film capacitors under high voltage stress was investigated. The automated ramp voltage test method was suggested. The experimental setup and software for experimental data processing were developed. Self-healing characteristics in the wide temperature range were obtained. It was found that increasing of operating temperature leads to decreasing of self-healing events number which corresponds to parametric or catastrophic failure. The critical values of cumulative self-healing energy for investigated capacitors until parametric and catastrophic failures were determined. Statistical analysis of self-healing events showed the presence of two types of processes with different energy distributions.

引用

页码：1902 / 1908

页数：7