A High-Speed High-Sensitivity Multi-Beam-Interferometer-Assistant SOA-PIN Photodetector With High Wavelength Drift Tolerance

被引：0
|
作者：
Zhou, Yulan [1 ]
Zhao, Jia [1 ]
Li, Xun [1 ,2 ]
机构：
[1] Shandong Univ, Sch Informat Sci & Engn, Qingdao 250100, Shandong, Peoples R China
[2] McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4L8, Canada
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 2024年 / 60卷 / 04期
关键词：
Noise; Photodetectors; Optical interferometry; Interference; Sensitivity; Bandwidth; Signal to noise ratio; ASE noise; optical filters; photodetectors; sensitivity; wavelength drift tolerance; COHERENCE TIME; BANDWIDTH; COMPACT; FILTERS; GAIN;
D O I：
10.1109/JQE.2024.3415162
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this work, we have proposed a multi-beam-interferometer-assistant SOA-PIN (MBIA-SOA-PIN) photodetector aiming at achieving a high sensitivity and a high wavelength drift tolerance by reducing the SOA's amplified spontaneous emission (ASE) noise through a finite impulse response (FIR)-type filter. Our simulation results show that the MBIA-SOA-PIN photodetector has a wavelength drift tolerance of +/- 1.92 nm, and a sensitivity of -18.2 dBm at a bit-error-rate (BER) of 10(-12) under a data rate of 240 Gbps. Compared with the GA-SOA-PIN photodetector which has the best performance among various types of photodetectors ever reported, the MBIA-SOA-PIN photodetector improves the wavelength drift tolerance and reduces the sensitivity dependence on polarization, at the trade-off of slightly lowering the sensitivity for TE polarized signals.
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页数：10
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