Simplified Techniques to Estimate Uncertainties for Antenna Gain Patterns Determined via Near-Field to Far-Field Transformation

被引:0
作者
Ulm, David [1 ]
Kleine-Ostmann, Thomas [1 ]
机构
[1] Phys Tech Bundesanstalt, Dept High Frequency & Electromagnet Fields, Braunschweig, Germany
来源
2024 18TH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION, EUCAP | 2024年
关键词
spherical near-field measurements; near-field to far-field transformation; measurement uncertainty;
D O I
10.23919/EuCAP60739.2024.10500976
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Depending on the frequency range of interest, the influence of chamber reflections can be a dominant contribution to the measurement uncertainty when calibrating antennas. Estimating this measurement uncertainty contribution is relatively cumbersome and, strictly speaking, requires a new analysis for each unknown antenna, since the influence of chamber reflections depends on the probe, the measurement chamber, the frequency being examined and the antenna under test. This article shows how modern transformation algorithms can be used to determine the influence of chamber reflections through redundant measurements. The focus here is on measurement procedures that are simple to carry out and can be integrated automatically into an existing measurement process without having to dismount the antenna under test.
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页数:5
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[31]   Three-Antenna Characterization Techniques Employing Spherical Near-Field Scanning With Higher-Order Probe Correction [J].
Mayhew-Ridgers, Gordon ;
van Jaarsveld, Paul A. ;
Odendaal, Johann W. .
IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 2023, 71 (09) :7220-7228