Position sensitive and energy dispersive x-ray detector based on silicon strip detector technology

被引:6
|
作者
Wiacek, P. [1 ]
Dabrowski, W. [1 ]
Fink, J. [2 ]
Fiutowski, T. [1 ]
Krane, H. -G. [2 ]
Loyer, F. [2 ]
Schwamberger, A. [2 ]
Swientek, K. [1 ]
Venanzi, C. [2 ]
机构
[1] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, PL-30059 Krakow, Poland
[2] Bruker AXS GmbH, D-76187 Karlsruhe, Germany
来源
关键词
Si microstrip and pad detectors; Electronic detector readout concepts (solid-state); X-ray fluorescence (XRF) systems; X-ray diffraction detectors; PERFORMANCE;
D O I
10.1088/1748-0221/10/04/P04002
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new position sensitive detector with a global energy resolution for the entire detector of about 380 eV FWHM for 8.04 keV line at ambient temperature is presented. The measured global energy resolution is defined by the energy spectra summed over all strips of the detector, and thus it includes electronic noise of the front-end electronics, charge sharing effects, matching of parameters across the channels and other system noise sources. The target energy resolution has been achieved by segmentation of the strips to reduce their capacitance and by careful optimization of the front-end electronics. The key design aspects and parameters of the detector are discussed briefly in the paper. Excellent noise and matching performance of the readout ASIC and negligible system noise allow us to operate the detector with a discrimination threshold as low as 1 keV and to measure fluorescence radiation lines of light elements, down to Al K alpha of 1.49 keV, simultaneously with measurements of the diffraction patterns. The measurement results that demonstrate the spectrometric and count rate performance of the developed detector are presented and discussed in the paper.
引用
收藏
页数:15
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