共 31 条
[1]
[Anonymous], 2024, SCOUT 350 HAR-Silicon AFM probe
[2]
Artigas R, 2011, OPTICAL MEASUREMENT OF SURFACE TOPOGRAPHY, P237
[3]
Beckmann P., 1963, SCATTERING ELECTROMA
[4]
A comparison of surface metrology techniques
[J].
7TH INTERNATIONAL SYMPOSIUM ON MEASUREMENT TECHNOLOGY AND INTELLIGENT INSTRUMENTS,
2005, 13
:458-465
[5]
Corle T.R., 1996, Confocal scanning optical microscopy and related imaging systems
[6]
de Groot P, 2011, OPTICAL MEASUREMENT OF SURFACE TOPOGRAPHY, P187
[8]
Hagemeier S., 2022, Ph.D. thesis