共 48 条
Hydrothermal vs. Electrochemical reduction of graphene oxide: A physico-chemical and quartz crystal microbalance study
被引:1
作者:

Keller, Caroline
论文数: 0 引用数: 0
h-index: 0
机构:
Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France

Barbillon, Gregory
论文数: 0 引用数: 0
h-index: 0
机构:
Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France
EPF Engn Sch, 55 Ave President Wilson, F-94230 Cachan, France Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France

Debiemme-Chouvy, Catherine
论文数: 0 引用数: 0
h-index: 0
机构:
Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France

Sel, Ozlem
论文数: 0 引用数: 0
h-index: 0
机构:
Coll France, Chim Solide & Energie, UMR 8260, Paris, France
RS2E, UMR CNRS 7314, CNRS FR 3459,33 Rue St Leu, F-80039 Amiens, France Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France

Perrot, Hubert
论文数: 0 引用数: 0
h-index: 0
机构:
Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France
机构:
[1] Sorbonne Univ, Lab Interfaces & Syst Electrochim, UMR 8235, CNRS, F-75005 Paris, France
[2] EPF Engn Sch, 55 Ave President Wilson, F-94230 Cachan, France
[3] Coll France, Chim Solide & Energie, UMR 8260, Paris, France
[4] RS2E, UMR CNRS 7314, CNRS FR 3459,33 Rue St Leu, F-80039 Amiens, France
来源:
关键词:
Reduced graphene oxide;
Hydrothermal reduction;
Electrochemical reduction;
Electrochemical impedance spectroscopy;
Electrochemical quartz crystal microbalance;
ELECTROACTIVE THIN-FILMS;
AC-ELECTROGRAVIMETRY;
FUNCTIONAL-GROUPS;
OXYGEN;
PERFORMANCE;
ELECTRODES;
BEHAVIOR;
XPS;
D O I:
10.1016/j.carbon.2024.119246
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Reduced Graphene Oxide possesses numerous interesting properties, making it one of the most studied materials today. By this way, applications in various fields, including fundamental research, can be found. Nevertheless, the complexity of reduced Graphene Oxide lies in its fabrication process which defines their properties. In this paper, two fabrication methods -electrochemical and hydrothermal reduction of graphene oxide - were compared using physico-chemical and electrogravimetric analysis. Our findings reveal significant morphological differences between the two methods, accompanied by different electrochemical behaviors, when tested in aqueous electrolyte (i.e. 0.5 M Na 2 SO 4 ). Specifically, electrochemically reduced graphene oxide exclusively involves sodium (whether hydrated or not) in its charge compensation mechanism, whereas hydrothermally reduced graphene oxide also involves proton in sodium sulfate solution.
引用
收藏
页数:10
相关论文
共 48 条
- [1] Effects of anion size on the electrochemical behavior of H2SO4-structured poly(o-toluidine) films. An ac-electrogravimetry study in acid solutions[J]. ELECTROCHIMICA ACTA, 2014, 132 : 561 - 573论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:Perrot, H.论文数: 0 引用数: 0 h-index: 0机构: CNRS, LISE, UPR 15, F-75005 Paris, France UPMC, LISE, F-75005 Paris, France CNRS, LISE, UPR 15, F-75005 Paris, FranceVicente, F.论文数: 0 引用数: 0 h-index: 0机构: Univ Valencia, Dept Quim Fis, E-46100 Valencia, Spain CNRS, LISE, UPR 15, F-75005 Paris, France
- [2] Kinetic and Mechanistic Aspects of a Poly(o-Toluidine)-Modified Gold Electrode. 2. Alternating Current Electrogravimetry Study in H2SO4 Solutions[J]. JOURNAL OF PHYSICAL CHEMISTRY C, 2012, 116 (29) : 15630 - 15640论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:Perrot, H.论文数: 0 引用数: 0 h-index: 0机构: CNRS, LISE, UPR 15, F-75005 Paris, France Univ Paris 06, LISE, F-75005 Paris, France CNRS, LISE, UPR 15, F-75005 Paris, FranceVicente, F.论文数: 0 引用数: 0 h-index: 0机构: Univ Valencia, Dept Quim Fis, E-46100 Valencia, Spain CNRS, LISE, UPR 15, F-75005 Paris, France
- [3] XPS and structural studies of high quality graphene oxide and reduced graphene oxide prepared by different chemical oxidation methods[J]. CERAMICS INTERNATIONAL, 2019, 45 (11) : 14439 - 14448论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:Mansour, S.论文数: 0 引用数: 0 h-index: 0机构: HBKU, QEERI, Qatar Fdn, POB 5825, Doha, Qatar HBKU, QEERI, Qatar Fdn, POB 5825, Doha, QatarAtieh, M. A.论文数: 0 引用数: 0 h-index: 0机构: HBKU, QEERI, Qatar Fdn, POB 5825, Doha, Qatar HBKU, QEERI, Qatar Fdn, POB 5825, Doha, Qatar
- [4] Sparsely Pillared Graphene Materials for High-Performance Supercapacitors: Improving Ion Transport and Storage Capacity[J]. ACS NANO, 2019, 13 (02) : 1443 - 1453论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:Dubois, Lionel论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, FranceCrosnier, Olivier论文数: 0 引用数: 0 h-index: 0机构: Univ Nantes, CNRS, Inst Mat Jean Rouxel IMN, F-44300 Nantes, France CNRS, RS2E, FR3459, F-80039 Amiens, France Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, FranceSimon, Patrice论文数: 0 引用数: 0 h-index: 0机构: Univ Toulouse, CIRIMAT, CNRS, INPT,UPS, F-31062 Toulouse, France CNRS, RS2E, FR3459, F-80039 Amiens, France Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, FranceLee, Daniel论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, FranceDe Paepe, Gael论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, FranceDuclairoir, Florence论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, CNRS, INAC, F-38000 Grenoble, France
- [5] Synthesis and Studies of Properties of Graphite Oxide and Thermally Expanded Graphite[J]. PROTECTION OF METALS AND PHYSICAL CHEMISTRY OF SURFACES, 2014, 50 (02) : 183 - 190Bannov, A. G.论文数: 0 引用数: 0 h-index: 0机构: Novosibirsk State Tech Univ, Novosibirsk 630073, Russia Novosibirsk State Tech Univ, Novosibirsk 630073, RussiaTimofeeva, A. A.论文数: 0 引用数: 0 h-index: 0机构: Novosibirsk State Tech Univ, Novosibirsk 630073, Russia Novosibirsk State Tech Univ, Novosibirsk 630073, RussiaShinkarev, V. V.论文数: 0 引用数: 0 h-index: 0机构: Novosibirsk State Tech Univ, Novosibirsk 630073, Russia Novosibirsk State Tech Univ, Novosibirsk 630073, RussiaDyukova, K. D.论文数: 0 引用数: 0 h-index: 0机构: Novosibirsk State Tech Univ, Novosibirsk 630073, Russia Novosibirsk State Tech Univ, Novosibirsk 630073, RussiaUkhina, A. V.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Inst Solid State Chem & Mechanochem, Siberian Branch, Novosibirsk 630092, Russia Novosibirsk State Tech Univ, Novosibirsk 630073, RussiaMaksimovskii, E. A.论文数: 0 引用数: 0 h-index: 0机构: Russian Acad Sci, Inst Inorgan Chem, Siberian Branch, Novosibirsk 630090, Russia Novosibirsk State Tech Univ, Novosibirsk 630073, RussiaYusin, S. I.论文数: 0 引用数: 0 h-index: 0机构: Novosibirsk State Tech Univ, Novosibirsk 630073, Russia Russian Acad Sci, Inst Solid State Chem & Mechanochem, Siberian Branch, Novosibirsk 630092, Russia Novosibirsk State Tech Univ, Novosibirsk 630073, Russia
- [6] Evaluation of solution-processed reduced graphene oxide films as transparent conductors[J]. ACS NANO, 2008, 2 (03) : 463 - 470Becerril, Hdctor A.论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USAMao, Jie论文数: 0 引用数: 0 h-index: 0机构: Nankai Univ, Coll Chem, Inst Polymer Chem, Ctr Nanoscale Sci & Technol, Tianjin 300071, Peoples R China Nankai Univ, Coll Chem, Inst Polymer Chem, Key Lab Funct Polymer Mat, Tianjin 300071, Peoples R China Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USALiu, Zunfeng论文数: 0 引用数: 0 h-index: 0机构: Nankai Univ, Coll Chem, Inst Polymer Chem, Ctr Nanoscale Sci & Technol, Tianjin 300071, Peoples R China Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USAStoltenberg, Randall M.论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USABao, Zhenan论文数: 0 引用数: 0 h-index: 0机构: Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USAChen, Yongsheng论文数: 0 引用数: 0 h-index: 0机构: Nankai Univ, Coll Chem, Inst Polymer Chem, Ctr Nanoscale Sci & Technol, Tianjin 300071, Peoples R China Nankai Univ, Coll Chem, Inst Polymer Chem, Key Lab Funct Polymer Mat, Tianjin 300071, Peoples R China Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA
- [7] Accessing the robustness of adventitious carbon for charge referencing (correction) purposes in XPS analysis: Insights from a multi-user facility data review[J]. APPLIED SURFACE SCIENCE, 2022, 597Biesinger, Mark C.论文数: 0 引用数: 0 h-index: 0机构: Univ Western Ontario, Surface Sci Western, 999 Collip Circle,Suite LL31, London, ON N6G 0J3, Canada Univ Western Ontario, Dept Chem, London, ON N6A 5B7, Canada Univ Western Ontario, Surface Sci Western, 999 Collip Circle,Suite LL31, London, ON N6G 0J3, Canada
- [8] Highly Ordered Graphene Polydopamine Composite Allowing Fast Motion of Cations: Toward a High-Performance Microsupercapacitor[J]. ADVANCED MATERIALS INTERFACES, 2023, 10 (32)Bouzina, Adnane论文数: 0 引用数: 0 h-index: 0机构: Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, France Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, FranceMeng, Rene论文数: 0 引用数: 0 h-index: 0机构: Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, France Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, FranceBazin, Cyrille论文数: 0 引用数: 0 h-index: 0机构: Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, France Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, FrancePerrot, Hubert论文数: 0 引用数: 0 h-index: 0机构: Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, France Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, FranceSel, Ozlem论文数: 0 引用数: 0 h-index: 0机构: Coll France, Chim Solide & Energie, UMR 8260, 11 Pl Marcelin Berthelot, F-75231 Paris 05, France Reseau Stockage Electrochim Energie RS2E, CNRS FR 3459, 33 Rue St Leu, F-80039 Amiens, France Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, FranceDebiemme-Chouvy, Catherine论文数: 0 引用数: 0 h-index: 0机构: Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, France Sorbonne Univ, CNRS, Lab Interfaces & Syst Electrochim, LISE UMR 8235, 4 Pl Jussieu, F-75005 Paris, France
- [9] Preventing Graphene from Restacking via Bioinspired Chemical Inserts: Toward a Superior 2D Micro-supercapacitor Electrode[J]. ACS APPLIED NANO MATERIALS, 2021, 4 (05) : 4964 - 4973Bouzina, Adnane论文数: 0 引用数: 0 h-index: 0机构: Sorbonne Univ, Lab Interfaces & Syst Electrochim, LISE, CNRS, F-75005 Paris, France Sorbonne Univ, Lab Interfaces & Syst Electrochim, LISE, CNRS, F-75005 Paris, FrancePerrot, Hubert论文数: 0 引用数: 0 h-index: 0机构: Sorbonne Univ, Lab Interfaces & Syst Electrochim, LISE, CNRS, F-75005 Paris, France Sorbonne Univ, Lab Interfaces & Syst Electrochim, LISE, CNRS, F-75005 Paris, France论文数: 引用数: h-index:机构:Debiemme-Chouvy, Catherine论文数: 0 引用数: 0 h-index: 0机构: Sorbonne Univ, Lab Interfaces & Syst Electrochim, LISE, CNRS, F-75005 Paris, France Sorbonne Univ, Lab Interfaces & Syst Electrochim, LISE, CNRS, F-75005 Paris, France
- [10] General equation for the determination of the crystallite size La of nanographite by Raman spectroscopy[J]. APPLIED PHYSICS LETTERS, 2006, 88 (16)Cançado, LG论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, JapanTakai, K论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, Japan论文数: 引用数: h-index:机构:Endo, M论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, JapanKim, YA论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, JapanMizusaki, H论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, JapanJorio, A论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, JapanCoelho, LN论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, JapanMagalhaes-Paniago, R论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, JapanPimenta, MA论文数: 0 引用数: 0 h-index: 0机构: Tokyo Inst Technol, Dept Chem, Meguro Ku, Tokyo 1528551, Japan