IEEE IAS/PELS Singapore Joint Chapter Hosts Seminar on Power Semiconductor Devices

被引：0

作者：

Cai, Aaron

机构：

来源：

IEEE POWER ELECTRONICS MAGAZINE | 2024年 / 11卷 / 02期

关键词：

D O I：

10.1109/MPEL.2024.3397069

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

On 8 January 2024, the IEEE Industry Applications Society (IAS)/Power Electronics Society (PELS) Singapore Joint Chapter, Centre for System Intelligence and Efficiency, and School of Electrical Engineering at Nanyang Technological University (NTU) in Singapore hosted a technical seminar at NTU that focused on the development trends and challenges in application and reliability of power semiconductor devices (Figure 1).

引用

页码：94 / 95

页数：2