Dual-wavelength spiral interferometry

被引：0
|
作者：
Tokizane, Yu [1 ]
Takashima, Ayato [2 ]
Hase, Eiji [1 ]
Yasui, Takeshi [1 ]
机构：
[1] Tokushima Univ, Inst PostLED Photon PLED, 2-1 Minami Josanjima, Tokushima 7708506, Japan
[2] Tokushima Univ, Grad Sch Sci & Technol Innovat, 2-1 Minami Josanjima, Tokushima 7708506, Japan
来源：
OPTICS LETTERS | 2024年 / 49卷 / 12期
基金：
日本学术振兴会;
关键词：
DIGITAL HOLOGRAPHIC MICROSCOPY; ORBITAL ANGULAR-MOMENTUM; PHASE; LIGHT;
D O I：
10.1364/OL.525588
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Spiral interferometry acquires the topography of the sample and determines the elevation or depression of the sample structure by a single measurement. The method has advantages in simple measurements and stable optical setup due to the coaxial interferometer. However, the measurable axial range was limited by the wavelength of the light. Here, we demonstrate dual-wavelength spiral interferometry without a significant modification to the original setup of the spiral interferometry. The retrieved phase profile using a synthesized wavelength of 3.33 mu m enlarges the measurable axial range with a magnification factor of 6.2 compared with that measured by the light at 532 nm. (c) 2024 Optica Publishing Group
引用
收藏
页码：3516 / 3519
页数：4
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