All-Digital High-Resolution Frequency Measurement SoC for Rapid MEMS Readouts

被引:0
|
作者
Sahu, Hitesh Kumar [1 ]
Sarkar, Emon [1 ]
Sathe, Pushkar [1 ]
Somappa, Laxmeesha [1 ,2 ]
机构
[1] Indian Inst Technol, Dept Elect Engn, Mumbai, Maharashtra, India
[2] IIT Bombay Ctr Semicond Technol SEMIX, Mumbai, Maharashtra, India
来源
2024 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, ISCAS 2024 | 2024年
关键词
Frequency estimation; Fast Fourier Transform (FFT); Candan Method; Frequency counters; Time to digital converters; MEMS; BIN SIZE; CONVERTER; ALGORITHM;
D O I
10.1109/ISCAS58744.2024.10558651
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
This work proposes an all-digital on-chip digital Frequency measuring system (FMS) that is intended to replace conventional low-resolution measuring instruments. The method of measurement is a two-step process with a coarse estimate followed by a fine resolution frequency estimation from three DFT samples using the Candan method. We describe the design, and performance evaluation, as a high-resolution rapid frequency measurement system, particularly for high-precision MEMS applications. The proposed FMS has been synthesized, implemented and verified on a Xilinx ZYNQ XC7Z020-1CLG400C SoC. The ASIC implementation of the SoC on a 65nm CMOS technology reveals that the design consumes 120 mW power at a 100 MHz clock while providing sub-5 ppm resolution with a readout time of 5.7 mu s, suitable for MEMS applications with bandwidth up to 10 MHz.
引用
收藏
页数:5
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