Effect of Annealing Temperature on the Microstructure, Mechanical Properties, and Electrical Conductivity of 4xxx Series Al-Based Alloys

被引：2

作者：

Khoshghadam-Pireyousefan, Mohammad ^{[1
]}

Javidani, Mousa ^{[1
]}

Maltais, Alexandre ^{[2
]}

Levesque, Julie ^{[3
]}

Chen, X. -Grant ^{[1
]}

机构：

[1] Univ Quebec Chicoutimi, Dept Appl Sci, Chicoutimi, PQ G7H 2B1, Canada

[2] Rio Tinto Aluminum, Arvida Res & Dev Ctr, Saguenay, PQ G7S 4K8, Canada

[3] Quebec Met Ctr, Trois Rivieres, PQ G9A 5E1, Canada

来源：

15TH INTERNATIONAL ALUMINIUM CONFERENCE, INALCO 2023 | 2023年 / 43卷

基金：

加拿大自然科学与工程研究理事会;

关键词：

Al-Si conductor alloys; annealing; electrical conductivity; mechanical properties; SI ALLOYS;

D O I：

10.3390/engproc2023043014

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This study investigated the effects of annealing on the microstructure, mechanical properties, and electrical conductivity (EC) of AA4043 rods produced through the Properzi CCR process. Annealing was conducted at two temperatures (200 degrees C and 300 degrees C) for 4 h. Characterization techniques were performed on the rod samples, including optical microscopy, EBSD, microhardness, tensile tests, and EC measurements. The results showed a significant improvement in EC with decreased mechanical strength during annealing. The sample annealed at 300 degrees C exhibited the most favorable combination of EC (57.48% IACS), microhardness (41 HV), and ultimate tensile strength (124 MPa). Furthermore, the image analysis revealed slight alterations in the shape factors of eutectic Si particles with increasing annealing temperature. In addition, EBSD results demonstrated that the annealing promoted the recrystallization process.

引用

页数：9

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