Determination and study of correlations of relative sensitivity factors in metal and metal oxide samples by glow discharge mass spectrometry

被引:1
作者
Liu, Anqi [1 ,2 ]
Zeng, Wang [1 ]
Zhu, Zhenli [3 ]
Zhuo, Shangjun [1 ]
Liu, Xuechao [4 ]
He, Chenggen [1 ]
Fang, Jinghong [4 ]
He, Huan [4 ]
Qian, Rong [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Ceram, Natl Ctr Inorgan Mass Spectrometry Shanghai, Shanghai 200050, Peoples R China
[2] Shanghai Normal Univ, Coll Chem & Mat Sci, Shanghai 200233, Peoples R China
[3] China Univ Geosci, State Key Lab Biogeol & Environm Geol, Wuhan 430074, Hubei, Peoples R China
[4] Chinese Acad Sci, Shanghai Inst Ceram, Artificial Crystal Res Ctr, Shanghai 200050, Peoples R China
基金
中国国家自然科学基金;
关键词
Glow discharge mass spectrometry; Relative sensitivity factor; Matrix effect; Lattice binding energy; The first ionization energy; Correlation analysis; IMPURITIES; ELEMENTS;
D O I
10.1016/j.microc.2024.111249
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The determination of relative sensitivity factor (RSF) plays a crucial role in achieving accurate quantitative analysis in glow discharge mass spectrometry (GD-MS). In this study, the RSF of typical elements in 14 metal and metal oxide matrices were determined, and their correlation with discharge parameters, matrix effects, the first ionization energies and sample shapes were investigated. It was found that discharge gas flow exerted a minor influence on RSF values in a nickel (Ni) metal sample, whereas discharge current significantly affected RSF, with variations up to 57.00 % for cobalt (59Co). The results revealed that matrix effects were more pronounced in metal oxides, with the relative standard deviation (RSD) of RSF for typical elements ranging from 25.17 % to 101.04 %. RSF values for the same element across different metal oxides showed a correlation with lattice binding energy (U0). Particularly, RSF values for 12 elements including 23Na, 27Al, 28Si, 45Sc, 52Cr, 56Fe, 59Co, 88Sr, 130Te, 138Ba, 139La and 140Ce within 7 metal oxides showed a significant correlation with U0 of the metal oxides. In terms of sample shape, pin samples generally yielded higher RSF values than flat samples in both metals and oxides. RSF accuracy was confirmed with standard samples of zirconium (Zr 73 MR10002 and Zr IARM 705-18) and iron oxides (Fe2O3-1 and Fe2O3-2) with relative errors within 17.50 % except for 12C. Subsequently, these RSF values were effectively utilized for the quantitative analysis of samples collected from the China Space Station (CSS). This comprehensive analysis elucidates the multifaceted influences on RSF values, enhancing the precision of trace element quantification in GD-MS.
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页数:11
相关论文
共 45 条
[1]  
Betti M., 2003, SPECTROSC EUR, V15, P15
[2]   Modeling of glow discharge sources with flat and pin cathodes and implications for mass spectrometric analysis [J].
Bogaerts, A ;
Gijbels, R .
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 1997, 8 (09) :1021-1029
[3]   Calculation of rate constants for asymmetric charge transfer, and their effect on relative sensitivity factors in glow discharge mass spectrometry [J].
Bogaerts, Annemie ;
Temelkov, Krassimir A. ;
Vuchkov, Nikolay K. ;
Gijbels, Renaat .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2007, 62 (04) :325-336
[4]   Silicon and indium as secondary cathodes for the analysis of solid alumina and sapphire by slow-flow direct-current glow discharge mass spectrometry [J].
Busam, Jochen ;
Paudel, Gagan ;
Di Sabatino, Marisa .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2022, 37 (01) :172-177
[5]   Application of 7N In as secondary cathode for the direct current-glow discharge mass spectrometry analysis of solid, fused high-purity quartz [J].
Busam, Jochen ;
Stokkan, Gaute ;
Muggerud, Astrid Marie F. ;
Di Sabatino, Marisa .
JOURNAL OF MASS SPECTROMETRY, 2021, 56 (08)
[6]   A study of matrix and admixture elements in fluorine-rich ionic conductors by pulsed glow discharge mass spectrometry [J].
Chuchina, Victoria ;
Gubal, Anna ;
Lyalkin, Yegor ;
Glumov, Oleg ;
Trefilov, Ivan ;
Sorokina, Angelina ;
Savinov, Sergey ;
Solovyev, Nikolay ;
Ganeev, Alexander .
RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 2020, 34 (11)
[7]   Electrochemical deposition of metals in the preparation of standard materials for glow discharge mass spectrometry [J].
Day, DA ;
Zook, AL ;
Barshick, CM ;
Hess, KR .
MICROCHEMICAL JOURNAL, 1997, 55 (02) :208-221
[8]  
de las Heras LA, 2000, MICROCHEM J, V67, P333
[10]   Determination of relative sensitivity factors for trace element analysis of solar cell silicon by fast-flow glow discharge mass spectrometry [J].
Di Sabatino, Marisa ;
Dons, Anne L. ;
Hinrichs, Joachim ;
Arnberg, Lars .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2011, 66 (02) :144-148