Three-point Bending Test Method Experimental Study for Package Strength and Crack Prediction through Finite Element Analysis

被引:0
作者
Wu, Minyan [1 ]
Shang, Yunpeng [1 ]
Tan, Tingzuo [1 ]
Zhou, Yonghua [1 ]
机构
[1] Samsung Semicond China R&D CO LTD, Packaging Technol Dev Team, Suzhou, Peoples R China
来源
2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT | 2023年
关键词
Package Strength; Three-point Bending Test; Crack Load; Finite Element Analysis;
D O I
10.1109/ICEPT59018.2023.10492178
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In recent years with the thinner, smaller, higher-density stack trend for package (PKG) design, the package crack risk becomes higher and higher in the assembly process and reliability tests. Therefore, it is crucial to establish an effective method to measure and predict package strength. The three-point bending (3PB) test is widely used to evaluate package strength. However, detailed parameters of the 3PB test vary among different manufacturers, making it difficult to compare data. Here, the main impact factors and mechanisms were evaluated to demonstrate the impact of 3PB test parameters on data. Additionally, a package strength prediction method was established using ANSYS software and Python based on epoxy mold compound (EMC) fracture. Results showed that the placement direction determined how the package crack and internal chips cracked before EMC instead of simultaneous fracture when the indenter was parallel to the package`s long side. Both crack force and strain were changed by more than 20% when one of the indenter sizes, span, or pretreatment was altered greatly. The effect of speed and strain gage type on the test results was less than 10%. Furthermore, 3PB finite element models were set up, in which boundary setting was solder ball side towards up, short side parallel to indenter, phi 0.6mm indenter size, and 12mm span without pretreatment. The crack force of a typical same-die structure package was predicted through iterations, starting with an initial load value of 100Nton and increments of 5Nton. It was observed that EMC and chips broke simultaneously under the setting test conditions, with the EMC fracture threshold of 130MPa adopted as the criterion for terminating iterations. The highest prediction accuracy of package 3PB strength was 92%, which assists in package crack risk management and provides guidance for future structured design.
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页数:6
相关论文
共 6 条
[1]   Study on Package Strength of uMCP (Multichip Package) for Mobile Application through Three-Point Bending Test and Simulation [J].
Che, Fa Xing ;
Ong, Yeow Chon ;
Ng, Hong Wan ;
Gan, Chong Leong ;
Glancey, Christopher ;
Takiar, Hem .
2020 IEEE 22ND ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2020, :57-62
[2]   Mechanical Suite of Flexural Bending Method for Electronic Memory Packages [J].
Liu, Vance ;
Arifeen, Shams ;
Bassett, Cassie ;
Chung, Min ;
Gan, C. L. ;
Takiar, Hem .
2021 IEEE INTERNATIONAL CONFERENCE ON SENSORS AND NANOTECHNOLOGY (SENNANO), 2021, :45-49
[3]   An improved three-point bending test method for the investigation of nanosecond laser dicing of ultrathin Si dies with Cu stabilization layer [J].
Marks, Michael Raj ;
Cheong, Kuan Yew ;
Hassan, Zainuriah .
MATERIALS CHARACTERIZATION, 2018, 136 :29-40
[4]   Effect of Nanosecond Laser Dicing on the Mechanical Strength and Fracture Mechanism of Ultrathin Si Dies With Cu Stabilization Layer [J].
Marks, Michael Raj ;
Hassan, Zainuriah ;
Cheong, Kuan Yew .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2015, 5 (12) :1885-1897
[5]   Correction factors to strength of thin silicon die in three- and four-point bending tests due to nonlinear effects [J].
Tsai, M. Y. ;
Huang, P. S. .
MICROELECTRONICS RELIABILITY, 2022, 128
[6]  
Xu C, 2016, IEEE INT SYMP PHYS, P297, DOI 10.1109/IPFA.2016.7564304