Polarization loss in rutile TiO2 doped with acceptor ions for microwave absorption

被引:5
作者
Zhou, Xiao-Bin [1 ]
Wu, Wen-Wen [1 ]
Song, Yue-Chan [1 ]
Han, Lu-Lu [1 ]
Liao, Wen-Peng [1 ]
Liu, Li-Ling [1 ]
Wang, Zhuo [2 ]
Chen, Xiao-Ming [1 ]
Liu, Peng [1 ]
机构
[1] Shaanxi Normal Univ, Sch Phys & Informat Technol, Xian 710062, Peoples R China
[2] Changan Univ, Sch Mat Sci & Engn, Xian 710064, Peoples R China
基金
中国国家自然科学基金;
关键词
Acceptor dopants; Rutile TiO2; Microwave absorption; Defect dipole clusters; Polarization loss; PERFORMANCE COLOSSAL PERMITTIVITY; DIELECTRIC RELAXATIONS; CERAMICS; CU;
D O I
10.1016/j.apsusc.2024.160767
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
With an increase in electromagnetic (EM) pollution, inducing polarization loss using lattice defects has become one of the main strategies for the design and optimization of a new generation of microwave absorbers. In this study, point defects in TiO2 absorbers are designed and controlled using a sol-gel method. The influences of the electronegativity difference and the ionic valence states of the dopant ions on the microwave absorption (MA) performance of rutile TiO2 composites are investigated. The results show that the defects such as oxygen vacancy (V-O(center dot center dot)) and Ti3+ can be adjusted continuously at a high-temperature sintering process. Cu2+, which has a larger electronegativity than Ti4+ (Cu-chi = 1.90(2+) > Ti-chi = 1.54(4+)) promotes the localization of electrons. Furthermore, compared with Ag+, which has a similar electronegativity (Ag-chi = 1.93(+) approximate to Cu-chi = 1.90(2+)), polyvalent copper ions (Cu2+ + e -> Cu+) enhance the electron-hopping process. The formed electron-pinning defect dipole clusters (Ti-Ti ', V-O(center dot center dot), Cu-Ti '', Cu-Ti ''', Ti3+ -> V-O(center dot center dot )<- Ti3+, Ti3+ -> V-O(center dot center dot)<- Cu2+ + e, Cu2+ + e -> Cu+, Ti4+ + e -> Ti3+) produce a stronger polarization relaxation process, which regulates the MA performance of TiO2 absorbers. Therefore, this study provides an essential reference for refining the EM wave attenuation performance of simple oxide absorbers.
引用
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页数:11
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