共 79 条
[1]
Proximity Effects of the Selective Atomic Layer Deposition of Cobalt on the Nanoscale: Implications for Interconnects
[J].
Breeden, Michael
;
Wang, Victor
;
Spiegelman, Jacob
;
Anurag, Ashay
;
Wolf, Steven F.
;
Moser, Daniel
;
Kanjolia, Ravindra K.
;
Moinpour, Mansour
;
Woodruff, Jacob
;
Nemani, Srinivas
;
Wong, Keith
;
Winter, Charles H.
;
Kummel, Andrew C.
.
ACS APPLIED NANO MATERIALS,
2021, 4 (08)
:8447-8454

Breeden, Michael
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Wang, Victor
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Spiegelman, Jacob
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机构:
Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Anurag, Ashay
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Wolf, Steven F.
论文数: 0 引用数: 0
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机构:
Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Moser, Daniel
论文数: 0 引用数: 0
h-index: 0
机构:
EMD Performance Mat, Haverhill, MA 01831 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Kanjolia, Ravindra K.
论文数: 0 引用数: 0
h-index: 0
机构:
EMD Performance Mat, Haverhill, MA 01831 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Moinpour, Mansour
论文数: 0 引用数: 0
h-index: 0
机构:
EMD Performance Mat, Haverhill, MA 01831 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Woodruff, Jacob
论文数: 0 引用数: 0
h-index: 0
机构:
EMD Performance Mat, Haverhill, MA 01831 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Nemani, Srinivas
论文数: 0 引用数: 0
h-index: 0
机构:
Appl Mat Inc, Sunnyvale, CA 95054 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Wong, Keith
论文数: 0 引用数: 0
h-index: 0
机构:
Appl Mat Inc, Sunnyvale, CA 95054 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Winter, Charles H.
论文数: 0 引用数: 0
h-index: 0
机构:
Wayne State Univ, Dept Chem, Detroit, MI 48202 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA

Kummel, Andrew C.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Dept Chem & Biochem, La Jolla, CA 92093 USA Univ Calif San Diego, Mat Sci & Engn Program, La Jolla, CA 92093 USA
[2]
Dependence of inherent selective atomic layer deposition of FeOx on Pt nanoparticles on the coreactant and temperature
[J].
Cai, Jiaming
;
Merkx, Marc J. M.
;
Lan, Yuxiao
;
Jing, Yao
;
Cao, Kun
;
Wen, Yanwei
;
Kessels, Wilhelmus M. M.
;
Mackus, Adriaan J. M.
;
Chen, Rong
.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
2021, 39 (01)

Cai, Jiaming
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, Wuhan 430074, Hubei, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China

Merkx, Marc J. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Eindhoven Univ Technol, Dept Appl Phys, POB 513, NL-5600 MB Eindhoven, Netherlands Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China

Lan, Yuxiao
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Mat Proc & Die & Mould Technol, Wuhan 430074, Hubei, Peoples R China
Huazhong Univ Sci & Technol, Sch Mat Sci & Technol, Wuhan 430074, Hubei, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China

Jing, Yao
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Mat Proc & Die & Mould Technol, Wuhan 430074, Hubei, Peoples R China
Huazhong Univ Sci & Technol, Sch Mat Sci & Technol, Wuhan 430074, Hubei, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China

Cao, Kun
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, Wuhan 430074, Hubei, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China

Wen, Yanwei
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Mat Proc & Die & Mould Technol, Wuhan 430074, Hubei, Peoples R China
Huazhong Univ Sci & Technol, Sch Mat Sci & Technol, Wuhan 430074, Hubei, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China

Kessels, Wilhelmus M. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Eindhoven Univ Technol, Dept Appl Phys, POB 513, NL-5600 MB Eindhoven, Netherlands Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China

Mackus, Adriaan J. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Eindhoven Univ Technol, Dept Appl Phys, POB 513, NL-5600 MB Eindhoven, Netherlands Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China

Chen, Rong
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, Wuhan 430074, Hubei, Peoples R China Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China
[3]
Atomic layer deposition for advanced nanomanufacturing
[J].
Cao Kun
;
Liu Xiao
;
Yang Fan
;
Chen Rong
.
SCIENCE CHINA-TECHNOLOGICAL SCIENCES,
2022, 65 (09)
:2218-2220

Cao Kun
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Liu Xiao
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Yang Fan
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Chen Rong
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China
[4]
Vacuum ultraviolet photochemical selective area atomic layer deposition of Al2O3 dielectrics
[J].
Chalker, P. R.
;
Marshall, P. A.
;
Dawson, K.
;
Brunell, I. F.
;
Sutcliffe, C. J.
;
Potter, R. J.
.
AIP ADVANCES,
2015, 5 (01)

Chalker, P. R.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England

Marshall, P. A.
论文数: 0 引用数: 0
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机构:
Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England

论文数: 引用数:
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Brunell, I. F.
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机构:
Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England

Sutcliffe, C. J.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England

Potter, R. J.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England Univ Liverpool, Ctr Mat & Struct, Liverpool L69 3GH, Merseyside, England
[5]
Fully Self-Aligned Via Integration for Interconnect Scaling Beyond 3nm Node
[J].
Chen, H. P.
;
Wu, Y. H.
;
Huang, H. Y.
;
Tsai, C. H.
;
Lee, S. K.
;
Lee, C. C.
;
Wei, T. H.
;
Yao, H. C.
;
Wang, Y. C.
;
Liao, C. Y.
;
Chang, H. K.
;
Lu, C. W.
;
Shue, Winston S.
;
Cao, Min
.
2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM),
2021,

Chen, H. P.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Wu, Y. H.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Huang, H. Y.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Tsai, C. H.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Lee, S. K.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Lee, C. C.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Wei, T. H.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Yao, H. C.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Wang, Y. C.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Liao, C. Y.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Chang, H. K.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Lu, C. W.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Shue, Winston S.
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan

Cao, Min
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co, Hsinchu, Taiwan Taiwan Semicond Mfg Co, Hsinchu, Taiwan
[6]
Chemistry for positive pattern transfer using area-selective atomic layer deposition
[J].
Chen, R
;
Bent, SF
.
ADVANCED MATERIALS,
2006, 18 (08)
:1086-+

Chen, R
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA

Bent, SF
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA
[7]
Investigation of self-assembled monolayer resists for hafnium dioxide atomic layer deposition
[J].
Chen, R
;
Kim, H
;
McIntyre, PC
;
Bent, SF
.
CHEMISTRY OF MATERIALS,
2005, 17 (03)
:536-544

Chen, R
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA

Kim, H
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA

McIntyre, PC
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA

Bent, SF
论文数: 0 引用数: 0
h-index: 0
机构:
Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA
[8]
Atomic layer deposition in advanced display technologies: from photoluminescence to encapsulation
[J].
Chen, Rong
;
Cao, Kun
;
Wen, Yanwei
;
Yang, Fan
;
Wang, Jian
;
Liu, Xiao
;
Shan, Bin
.
INTERNATIONAL JOURNAL OF EXTREME MANUFACTURING,
2024, 6 (02)

Chen, Rong
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Cao, Kun
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Wen, Yanwei
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mat Sci & Engn, State Key Lab Mat Proc & Die & Mould Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Yang, Fan
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Wang, Jian
论文数: 0 引用数: 0
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机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Liu, Xiao
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China

Shan, Bin
论文数: 0 引用数: 0
h-index: 0
机构:
Huazhong Univ Sci & Technol, Sch Mat Sci & Engn, State Key Lab Mat Proc & Die & Mould Technol, Wuhan 430074, Peoples R China Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Intelligent Mfg Equipment & Technol, Wuhan 430074, Peoples R China
[9]
Inhibitor-Free Area-Selective Atomic Layer Deposition with Feature Size Down to Nearly 10 nm
[J].
Chou, Chun-Yi
;
Mo, Chi-Lin
;
Chuu, Chih-Piao
;
Wang, Ting-Yun
;
Huang, Chin-Chao
;
Hou, Cheng-Hung
;
Chuang, Chun-Ho
;
Jiang, Yu-Sen
;
Shyue, Jing-Jong
;
Chen, Miin-Jang
.
CHEMISTRY OF MATERIALS,
2023, 35 (03)
:1107-1115

Chou, Chun-Yi
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan

Mo, Chi-Lin
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan

Chuu, Chih-Piao
论文数: 0 引用数: 0
h-index: 0
机构:
Taiwan Semicond Mfg Co TSMC, Corp Res, Hsinchu 30844, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan

Wang, Ting-Yun
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan

Huang, Chin-Chao
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan

Hou, Cheng-Hung
论文数: 0 引用数: 0
h-index: 0
机构:
Acad Sinica, Res Ctr Appl Sci, Taipei 11529, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan

Chuang, Chun-Ho
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan

Jiang, Yu-Sen
论文数: 0 引用数: 0
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机构:
Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan

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Chen, Miin-Jang
论文数: 0 引用数: 0
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机构:
Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 10617, Taiwan
[10]
Perspective: New process technologies required for future devices and scaling
[J].
Clark, R.
;
Tapily, K.
;
Yu, K. -H.
;
Hakamata, T.
;
Consiglio, S.
;
O'Meara, D.
;
Wajda, C.
;
Smith, J.
;
Leusink, G.
.
APL MATERIALS,
2018, 6 (05)

Clark, R.
论文数: 0 引用数: 0
h-index: 0
机构:
Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA

Tapily, K.
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机构:
Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA

Yu, K. -H.
论文数: 0 引用数: 0
h-index: 0
机构:
Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA

Hakamata, T.
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Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA

Consiglio, S.
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Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA

O'Meara, D.
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Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA

Wajda, C.
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Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA

Smith, J.
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Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA

Leusink, G.
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Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA Amer LLC, TEL Technol Ctr, 255 Fuller Rd,Suite 244, Albany, NY 12203 USA