Silicon photonic bowtie cavities with atomic-scale dimensions

被引:0
|
作者
Babar, Ali Nawaz [1 ,2 ]
Weis, Thor August Schimmell [1 ]
Tsoukalas, Konstantinos [1 ]
Kadkhodazadeh, Shima [2 ,3 ]
Arregui, Guillermo [1 ]
Lahijani, Babak Vosoughi [1 ,2 ]
Stobbe, Soren [1 ,2 ]
机构
[1] Tech Univ Denmark, Dept Elect & Photon Engn, DTU Electro, Bldg 343, DK-2800 Lyngby, Denmark
[2] Tech Univ Denmark, NanoPhoton Ctr Nanophoton, Orsteds Plads 345A, DK-2800 Lyngby, Denmark
[3] Tech Univ Denmark, DTU Nanolab, Bldg 307, DK-2800 Lyngby, Denmark
基金
欧洲研究理事会; 新加坡国家研究基金会;
关键词
nanocavities; photonic crystals; atomic-scale confinement; nanophotonics; nanofabrication; self-assembly; NANOCAVITY; LIGHT;
D O I
10.1117/12.3001866
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Recent progress in photonics has highlighted the importance of miniaturization, particularly in achieving dielectric bowtie cavities with small mode volumes, which were previously limited to plasmonics. This study presents a novel method that combines top-down nanopatterning and bottom-up self-assembly to fabricate photonic cavities with atomic-scale dimensions. By utilizing surface forces, we demonstrate waveguide-coupled silicon photonic cavities with high quality factors, confining light to atomic-scale air gaps with an aspect ratio above 100, corresponding to mode volumes more than 100 times below the diffraction limit. These cavities exhibit unprecedented figures of merit for enhancing light-matter interaction and enable charting hitherto inaccessible regimes of solid-state quantum electrodynamics.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] Atomic-scale manipulation
    Morrissey, S
    CHEMICAL & ENGINEERING NEWS, 2004, 82 (38) : 10 - 10
  • [32] Atomic-scale visualization
    Hodges, M
    COMPUTER GRAPHICS WORLD, 2000, 23 (11) : 46 - +
  • [33] Atomic-scale chemical-analyses of niobium for superconducting radio-frequency cavities
    Yoon, Kevin E.
    Seidman, David N.
    Bauer, Pierre
    Boffo, Christian
    Antoine, Claire
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2007, 17 (02) : 1314 - 1317
  • [34] Measurements and Modeling of Atomic-Scale Sidewall Roughness and Losses in Integrated Photonic Devices
    Roberts, Samantha
    Ji, Xingchen
    Cardenas, Jaime
    Corato-Zanarella, Mateus
    Lipson, Michal
    ADVANCED OPTICAL MATERIALS, 2022, 10 (18)
  • [35] Atomic-scale simulations of cascade overlap and damage evolution in silicon carbide
    Gao, F
    Weber, WJ
    JOURNAL OF MATERIALS RESEARCH, 2003, 18 (08) : 1877 - 1883
  • [36] Atomic-scale simulation of defect-induced amorphization of crystalline silicon
    Maroudas, D
    Barone, ME
    Meng, BQ
    PROCEEDINGS OF THE FOURTH INTERNATIONAL SYMPOSIUM ON PROCESS PHYSICS AND MODELING IN SEMICONDUCTOR TECHNOLOGY, 1996, 96 (04): : 387 - 397
  • [37] Atomic-scale modelling of kinetic processes occurring during silicon oxidation
    Bongiorno, A
    Pasquarello, A
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2005, 17 (21) : S2051 - S2063
  • [38] Engineering Spin-Orbit Interactions in Silicon Qubits at the Atomic-Scale
    Hsueh, Yu-Ling
    Keith, Daniel
    Chung, Yousun
    Gorman, Samuel K.
    Kranz, Ludwik
    Monir, Serajum
    Kembrey, Zachary
    Keizer, Joris G.
    Rahman, Rajib
    Simmons, Michelle Y.
    ADVANCED MATERIALS, 2024, 36 (26)
  • [39] Atomic-scale studies of native point defect and nonstoichiometry in silicon oxynitride
    Liu, B.
    Wang, J. Y.
    Li, F. Z.
    Tong, Q. F.
    Zhou, Y. C.
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2009, 70 (06) : 982 - 988
  • [40] SCANNING TUNNELING MICROSCOPE FABRICATION OF ATOMIC-SCALE MEMORY ON A SILICON SURFACE
    HUANG, DH
    UCHIDA, H
    AONO, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (2A): : L190 - L193