Thermal annealing effects on the structural and electrical properties of Ag2La thin films deposited by thermal evaporation technique

Herein Ag2La thin films are fabricated by a vacuum coating method and subjected to a thermal annealing process. The thermally heated of films at 200 C-o increased the crystallite sizes and improved the crystalline structure of the films. For these films the electrical conductivity measurements which were handled in the temperature range of 300440 K. The conductivity analyses indicated that the transport of charged particles is dominated by the thermionic emission and by the variable range hopping conduction mechanisms. The annealing of films shifted the impurity levels and decreased; the degree of disorder, the average hopping distance and the average hopping energy.