High-frequency characteristics of multilayer graphene nanoribbon interconnects: Exploring the implications OF SKIN effect

A study is undertaken to explore the frequency -dependent traits of crosstalk delay (X -D), crosstalk noise area (X -NA), and the mean time to failure induced by electromigration (EM-MTF) in interconnects constructed from lithium -doped multilayer graphene nanoribbon (Li-MLGNR) and their optimized counterparts, known as optimized Li-MLGNR (O-LiMLGNR) interconnects. The analysis is based on the skin depth and impedance model incorporating scatterers and the finite thickness of the interconnect. The obtained high -frequency impedance and performance characteristics reveals that O-LiMLGNR outperforms Li-MLGNR, rough copper, and mixed carbon nanotube bundle in terms of X -D, X -NA, and EM-MTF. Subsequently, the performance of OLiMLGNR, limited by process and temperature variations, is analyzed at high frequencies under the influence of skin -effect. As a result of variations in process parameters and temperature, the OLiMLGNR exhibits an increase in variations of X -D and X -NA, accompanied by a reduction in variation of EM-MTF as the frequency increases.