Novel Approach to Mitigate Parasitic Oscillation of Power Modules with Parallel Connected SiC-MOSFETs

被引:0
作者
Takeda, Shun [1 ]
Miyake, Eitaro [1 ]
Kono, Hiroshi [2 ]
Ohashi, Teruyuki [3 ]
Iguchi, Tomohiro [4 ]
Kodani, Kazuya [5 ]
机构
[1] Toshiba Elect Devices & Storage Corp, Elect Devices & Storage Res & Dev Ctr, Kawasaki, Kanagawa, Japan
[2] Toshiba Elect Devices & Storage Corp, Adv Semicond Device Dev Ctr, Oita, Hyogo, Japan
[3] Toshiba Co Ltd, Corp Res & Dev, Kawasaki, Kanagawa, Japan
[4] Toshiba Co Ltd, Corp Mfg Engn Ctr, Kawasaki, Kanagawa, Japan
[5] Toshiba Infrastruct Syst & Solut Corp, Infrastruct Syst Res & Dev Ctr, Tokyo, Japan
来源
2024 36TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND IC S, ISPSD 2024 | 2024年
关键词
SiC; MOSFET; power module; switching; parasitic oscillation; parallel connection;
D O I
10.1109/ISPSD59661.2024.10579559
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In a power module with multiple MOSFETs connected in parallel, a type of current oscillation known as "parasitic oscillation" can occur during switching. Parasitic oscillation can lead to module failure, so a means of mitigating parasitic oscillation is required. In this paper, we derived oscillation conditions using the Monte Carlo method as well as theoretical analysis of an equivalent circuit, using a simplified circuit model of two chips connected in parallel. Furthermore, we showed that it is possible to apply the oscillation condition to any number of parallel chips by considering them to be equivalent to a two-chip model by performing an appropriate equivalent-circuit transformation. According to these conditions, increasing the value of Lg/Ls is effective for mitigating parasitic oscillation. To verify the above considerations, we fabricated power modules with different Lg/Ls values and performed switching measurements. The results revealed that the module with higher Lg/Ls values mitigated oscillation without increasing switching loss. This novel approach might be useful in designing the wiring structure of power modules.
引用
收藏
页码:514 / 517
页数:4
相关论文
共 50 条
  • [41] The Effect of Electrothermal Nonuniformities on Parallel Connected SiC Power Devices Under Unclamped and Clamped Inductive Switching
    Hu, Ji
    Alatise, Olayiwola
    Gonzalez, Jose Angel Ortiz
    Bonyadi, Roozbeh
    Ran, Li
    Mawby, Philip A.
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2016, 31 (06) : 4526 - 4535
  • [42] A Novel Load Regulation Technique for Power-SoC with Parallel-Connected POLs
    Abe, Seiya
    Matsumoto, Satoshi
    Ninomiya, Tamotsu
    IEEJ JOURNAL OF INDUSTRY APPLICATIONS, 2015, 4 (06) : 732 - 737
  • [43] Parasitic capacitances and inductances hindering utilization of the fast switching potential of SiC power modules. Simulation model verified by experiment
    Tiwari, S.
    Midtgard, O. -M.
    Undeland, T. M.
    Lund, R.
    2017 19TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'17 ECCE EUROPE), 2017,
  • [44] Layout-Dominated Dynamic Current Balancing Analysis of Multichip SiC Power Modules Based on Coupled Parasitic Network Model
    Ge, Yuxin
    Wang, Zhiqiang
    Yang, Yayong
    Qian, Cheng
    Xin, Guoqing
    Shi, Xiaojie
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2023, 38 (02) : 2240 - 2251
  • [45] Cryogenic Low-Voltage/High-Current DC Power Source Using Multi-Parallel-Connected MOSFETs
    Kondo, Yuichi
    Fukano, Shohei
    Ninomiya, Akira
    Ishigohka, Takeshi
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2009, 19 (03) : 2337 - 2340
  • [46] Mitigating Drain Source Voltage Oscillation with Low Switching Losses for SiC Power MOSFETs Using FPGA-Controlled Active Gate Driver
    Li, Zheming
    Maier, Robert W.
    Bakran, Mark-M
    2020 22ND EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'20 ECCE EUROPE), 2020,
  • [47] A New Characterization Technique for Extracting Parasitic Inductances of SiC Power MOSFETs in Discrete and Module Packages Based on Two-Port S-Parameters Measurement
    Liu, Tianjiao
    Wong, Thomas T. Y.
    Shen, Z. John
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2018, 33 (11) : 9819 - 9833
  • [48] Single-Input Dual-Output Digital Gate Driver IC Automatically Equalizing Drain Current Variations of Two Parallel-Connected SiC MOSFETs
    Horii, Kohei
    Hata, Katsuhiro
    Hayashi, Shin-Ichiro
    Wada, Keiji
    Omura, Ichiro
    Takamiya, Makoto
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2025, 40 (01) : 467 - 485
  • [49] Equalization of DC and Surge Components of Drain Current of Two Parallel-Connected SiC MOSFETs Using Single-Input Dual-Output Digital Gate Driver IC
    Horii, Kohei
    Morikawa, Ryuzo
    Katada, Ryunosuke
    Hata, Katsuhiro
    Sakurai, Takayasu
    Hayashi, Shin-Ichiro
    Wada, Keiji
    Omura, Ichiro
    Takamiya, Makoto
    2022 IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, APEC, 2022, : 1406 - 1412
  • [50] The Mechanism of Short-Circuit Oscillations in Automotive-Grade Multi-Chip Parallel Power Modules and an Effective Mitigation Approach
    Ma, Kun
    Sun, Yameng
    Liu, Xun
    Song, Yifan
    Li, Xuehan
    Shi, Huimin
    Feng, Zheng
    Zhang, Xiao
    Zhou, Yang
    Liu, Sheng
    SENSORS, 2024, 24 (09)