X-ray-induced acoustic effect-based microscopic imaging

被引：0

作者：

Choi, Seongwook ^{[1
]}

Park, Sinyoung ^{[2
]}

Kim, Jiwoong ^{[2
]}

Kim, Hyunhee ^{[2
]}

Cho, Seonghee ^{[2
]}

Kim, Sunam ^{[3
]}

Park, Jaeku ^{[3
]}

Kim, Chulhong ^{[1
,2
]}

机构：

[1] Pohang Univ Sci & Technol POSTECH, POSTECH Inst Artificial Intelligence, 77 Cheongam Ro, Pohang 37673, South Korea

[2] POSTECH, Med Device Innovat Ctr, Dept Elect Engn Convergence IT Engn Mech Engn Med, 77 Cheongam Ro, Pohang 37673, South Korea

[3] Pohang Accelerator Lab, 77 Cheongam Ro, Pohang 37673, South Korea

来源：

PHOTONS PLUS ULTRASOUND: IMAGING AND SENSING 2024 | 2024年 / 12842卷

基金：

新加坡国家研究基金会;

关键词：

X-ray induced acoustic imaging; X-ray induced acoustic microscopy; X-ray free-electron laser; SPECTROSCOPY; LASER;

D O I：

10.1117/12.3001182

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

The X-ray free-electron laser (XFEL) has revolutionized X-ray imaging with its high power, short pulse width, low emittance, and high coherence. We introduce X-ray-induced acoustic microscopy (XFELAM), utilizing the X-ray induced acoustic (XA) effect. We verified the XA effect and achieved micron-scale resolution by imaging patterned tungsten targets with drilled circles. XFELAM expands XFEL capabilities, enabling high-resolution visualization of materials and systems. This technique complements existing XFEL methods and promises advancements in fundamental research across fields. XAM's unique features benefit materials science, nanotechnology, and biophysics, contributing to a deeper understanding of scientific phenomena and discoveries.

引用

页数：5

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