X-ray-induced acoustic effect-based microscopic imaging

The X-ray free-electron laser (XFEL) has revolutionized X-ray imaging with its high power, short pulse width, low emittance, and high coherence. We introduce X-ray-induced acoustic microscopy (XFELAM), utilizing the X-ray induced acoustic (XA) effect. We verified the XA effect and achieved micron-scale resolution by imaging patterned tungsten targets with drilled circles. XFELAM expands XFEL capabilities, enabling high-resolution visualization of materials and systems. This technique complements existing XFEL methods and promises advancements in fundamental research across fields. XAM's unique features benefit materials science, nanotechnology, and biophysics, contributing to a deeper understanding of scientific phenomena and discoveries.