2024 IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, APEC
|
2024年
关键词:
Wide-band gap device;
Silicon Carbide;
Losses;
modeling;
Double Pulse test;
Power converter;
MOSFET;
METHODOLOGY;
VOLTAGE;
D O I:
10.1109/APEC48139.2024.10509361
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Despite the increasing improvements of the Wide Band Gap (WBG) semiconductors for power converters, the definition of an accurate losses model still results crucial for better estimating the efficiency, thus optimizing the design of a proper cooling system while minimizing the overall size of the converter itself. With the aim of improving the performance of the current system-level model for SiC-based converters, this paper proposes a losses model based on a data-driven approach able to achieve higher accuracy with a reasonable computational cost. In detail, starting from the creation of an input dataset according to datasheet information or experimental characterization, it is demonstrated that the execution of non-linear fitting operations on the energy losses characteristics can strongly improve the estimation accuracy compared to the most common linear approximations performed by the current literature and the power electronics industries. Referring to the same input dataset, a comparative analysis based on experimental results between the energy losses estimated by a common numerical tool and the proposed modeling approach is presented to highlight the higher accuracy.
机构:
Univ Chinese Acad Sci, Beijing 100190, Peoples R China
Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R ChinaUniv Chinese Acad Sci, Beijing 100190, Peoples R China
Duan, Zhuolin
;
Fan, Tao
论文数: 0引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R ChinaUniv Chinese Acad Sci, Beijing 100190, Peoples R China
Fan, Tao
;
Wen, Xuhui
论文数: 0引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R ChinaUniv Chinese Acad Sci, Beijing 100190, Peoples R China
Wen, Xuhui
;
Zhang, Dong
论文数: 0引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R ChinaUniv Chinese Acad Sci, Beijing 100190, Peoples R China
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R ChinaUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Li, Xuan
;
Jiang, Junning
论文数: 0引用数: 0
h-index: 0
机构:
Texas A&M Univ, College Stn, TX 77840 USAUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Jiang, Junning
;
Huang, Alex Q.
论文数: 0引用数: 0
h-index: 0
机构:
North Carolina State Univ, FREEDM Syst Ctr, Raleigh, NC 27695 USAUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Huang, Alex Q.
;
Guo, Suxuan
论文数: 0引用数: 0
h-index: 0
机构:
North Carolina State Univ, Raleigh, NC 27695 USAUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Guo, Suxuan
;
Deng, Xiaochuan
论文数: 0引用数: 0
h-index: 0
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R ChinaUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Deng, Xiaochuan
;
Zhang, Bo
论文数: 0引用数: 0
h-index: 0
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R ChinaUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Zhang, Bo
;
She, Xu
论文数: 0引用数: 0
h-index: 0
机构:
GE Global Res, Power Elect Lab, Niskayuna, NY 12309 USAUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
机构:
Univ Chinese Acad Sci, Beijing 100190, Peoples R China
Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R ChinaUniv Chinese Acad Sci, Beijing 100190, Peoples R China
Duan, Zhuolin
;
Fan, Tao
论文数: 0引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R ChinaUniv Chinese Acad Sci, Beijing 100190, Peoples R China
Fan, Tao
;
Wen, Xuhui
论文数: 0引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R ChinaUniv Chinese Acad Sci, Beijing 100190, Peoples R China
Wen, Xuhui
;
Zhang, Dong
论文数: 0引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R ChinaUniv Chinese Acad Sci, Beijing 100190, Peoples R China
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R ChinaUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Li, Xuan
;
Jiang, Junning
论文数: 0引用数: 0
h-index: 0
机构:
Texas A&M Univ, College Stn, TX 77840 USAUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Jiang, Junning
;
Huang, Alex Q.
论文数: 0引用数: 0
h-index: 0
机构:
North Carolina State Univ, FREEDM Syst Ctr, Raleigh, NC 27695 USAUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Huang, Alex Q.
;
Guo, Suxuan
论文数: 0引用数: 0
h-index: 0
机构:
North Carolina State Univ, Raleigh, NC 27695 USAUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Guo, Suxuan
;
Deng, Xiaochuan
论文数: 0引用数: 0
h-index: 0
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R ChinaUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Deng, Xiaochuan
;
Zhang, Bo
论文数: 0引用数: 0
h-index: 0
机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R ChinaUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
Zhang, Bo
;
She, Xu
论文数: 0引用数: 0
h-index: 0
机构:
GE Global Res, Power Elect Lab, Niskayuna, NY 12309 USAUniv Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China