Large field-of-view pine wilt disease tree detection based on improved YOLO v4 model with UAV images

被引:3
作者
Zhang, Zhenbang [1 ,2 ,3 ]
Han, Chongyang [1 ]
Wang, Xinrong [4 ]
Li, Haoxin [1 ]
Li, Jie [5 ]
Zeng, Jinbin [1 ]
Sun, Si [6 ]
Wu, Weibin [1 ]
机构
[1] South China Agr Univ, Coll Engn, Guangzhou, Peoples R China
[2] Shaoguan Univ, Guangdong Prov Key Lab Utilizat & Conservat Food &, Shaoguan, Peoples R China
[3] Shaoguan Univ, Coll Intelligent Engn, Shaoguan, Peoples R China
[4] South China Agr Univ, Coll Plant Protect, Guangzhou, Peoples R China
[5] Nankai Univ, Coll Artificial Intelligence, Tianjin, Peoples R China
[6] South China Agr Univ, Coll Forestry & Landscape Architecture, Guangzhou, Peoples R China
关键词
pine wilt disease; UAV images; large field-of-view; deep learning; target detection; FEATURE FUSION;
D O I
10.3389/fpls.2024.1381367
中图分类号
Q94 [植物学];
学科分类号
071001 ;
摘要
Introduction Pine wilt disease spreads rapidly, leading to the death of a large number of pine trees. Exploring the corresponding prevention and control measures for different stages of pine wilt disease is of great significance for its prevention and control.Methods To address the issue of rapid detection of pine wilt in a large field of view, we used a drone to collect multiple sets of diseased tree samples at different times of the year, which made the model trained by deep learning more generalizable. This research improved the YOLO v4(You Only Look Once version 4) network for detecting pine wilt disease, and the channel attention mechanism module was used to improve the learning ability of the neural network.Results The ablation experiment found that adding the attention mechanism SENet module combined with the self-designed feature enhancement module based on the feature pyramid had the best improvement effect, and the mAP of the improved model was 79.91%.Discussion Comparing the improved YOLO v4 model with SSD, Faster RCNN, YOLO v3, and YOLO v5, it was found that the mAP of the improved YOLO v4 model was significantly higher than the other four models, which provided an efficient solution for intelligent diagnosis of pine wood nematode disease. The improved YOLO v4 model enables precise location and identification of pine wilt trees under changing light conditions. Deployment of the model on a UAV enables large-scale detection of pine wilt disease and helps to solve the challenges of rapid detection and prevention of pine wilt disease.
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页数:14
相关论文
共 45 条
[1]  
Acharya A., 2014, Comput. Sci, V11, P689
[2]  
[Anonymous], 2013, Foundation Comput. Sci. (FCS), DOI [DOI 10.5120/12773-9862, 10.5120/12773-9862]
[3]  
Asai E, 2001, FOREST PATHOL, V31, P241, DOI 10.1046/j.1439-0329.2001.00245.x
[4]   ViBe: A Universal Background Subtraction Algorithm for Video Sequences [J].
Barnich, Olivier ;
Van Droogenbroeck, Marc .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2011, 20 (06) :1709-1724
[5]  
Bochkovskiy A, 2020, Arxiv, DOI [arXiv:2004.10934, 10.48550/arXiv.2004.10934, DOI 10.48550/ARXIV.2004.10934]
[6]   Research on edge intelligent recognition method oriented to transmission line insulator fault detection [J].
Deng, Fangming ;
Xie, Zhongxin ;
Mao, Wei ;
Li, Bing ;
Shan, Yun ;
Wei, Baoquan ;
Zeng, Han .
INTERNATIONAL JOURNAL OF ELECTRICAL POWER & ENERGY SYSTEMS, 2022, 139
[7]   Real-time defects detection for apple sorting using NIR cameras with pruning-based YOLOV4 network [J].
Fan, Shuxiang ;
Liang, Xiaoting ;
Huang, Wenqian ;
Zhang, Vincent Jialong ;
Pang, Qi ;
He, Xin ;
Li, Lianjie ;
Zhang, Chi .
COMPUTERS AND ELECTRONICS IN AGRICULTURE, 2022, 193
[8]   Effects of pine wilt disease invasion on soil properties and Masson pine forest communities in the Three Gorges reservoir region, China [J].
Gao, Ruihe ;
Shi, Juan ;
Huang, Ruifen ;
Wang, Zhuang ;
Luo, Youqing .
ECOLOGY AND EVOLUTION, 2015, 5 (08) :1702-1716
[9]   What Makes for Effective Detection Proposals? [J].
Hosang, Jan ;
Benenson, Rodrigo ;
Dollar, Piotr ;
Schiele, Bernt .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2016, 38 (04) :814-830
[10]  
Hu J, 2018, PROC CVPR IEEE, P7132, DOI [10.1109/CVPR.2018.00745, 10.1109/TPAMI.2019.2913372]