Enhanced antireflective and laser damage resistance of refractive-index gradient SiO2 nanostructured films at 1064 nm

被引:1
作者
Wan, Lili [1 ]
Yang, Jie [1 ]
Liu, Xiaoru [1 ]
Zhu, Jiayi [1 ,3 ]
Xu, Gang [1 ]
Hao, Chenchun [1 ]
Chen, Xuecheng [2 ]
Xiong, Zhengwei [1 ]
机构
[1] Southwest Univ Sci & Technol, Sch Math & Phys, Joint Lab Extreme Condit Matter Properties, Mianyang 621010, Peoples R China
[2] West Pomeranian Univ Technol, Fac Chem Technol & Engn, Dept Nanomat Physicochem, Piastow Ave 42, PL-71065 Szczecin, Poland
[3] China Aerodynam Res & Dev Ctr, Key Lab Icing & Anti Deicing, Mianyang 621000, Peoples R China
基金
中国国家自然科学基金;
关键词
SiO2 nanostructured films; Sol-gel procedure; Refractive-index gradient; Antireflective; Laser damage resistance; COATINGS; SILICA; MECHANISM;
D O I
10.2478/pjct-2024-0014
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
A facile sol-gel procedure was employed to create refractive-index gradient SiO2 antireflective (AR) films. A monolayer film, characterized by the porous crosslinking framework, was fabricated with a designed volume ratio mixture both with colloidal silica suspension and soluble organic polysiloxane. The upper layer for the bilayer film was a hexamethylisilazane (HMDS) modified colloidal silica suspension, leading to the film surface transfer to hydrophobic. The strategic design of nanostructures in the bottom and upper layers resulted in a refractive-index gradient SiO2 film with enhanced AR properties. The bilayer film demonstrated a transmittance of 99.5% at 1064 nm, accompanied by a notable reduction in reflectivity. Moreover, the laser-induced damage threshold of the bilayer film was increased by 30%, rising to as high as 24.7 J/cm(2). The SiO2 nanostructured film both showed a refractive-index gradient structure with excellent AR properties and exhibited good laser damage resistance.
引用
收藏
页码:25 / 30
页数:6
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