Study on the terahertz domain dielectric relaxation response and mechanism of thermal-oxidative aged cross-linked polyethylene

被引:0
作者
Wang, Mengqi [1 ]
Wang, Shihang [1 ]
Li, Xinyu [1 ]
Feng, Yang [1 ]
Wang, Jingran [1 ]
Li, Shengtao [1 ]
机构
[1] Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian, Peoples R China
来源
HIGH VOLTAGE | 2024年 / 9卷 / 06期
基金
中国国家自然科学基金;
关键词
LOW-DENSITY POLYETHYLENE; CABLE INSULATION; MOLECULAR-DYNAMICS; ANTIOXIDANTS; IDENTIFICATION; SPECTROSCOPY; DEGRADATION; BEHAVIOR; DEFECTS;
D O I
10.1049/hve2.12463
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To further study the thermal-oxidative ageing mechanism of crosslinked polyethylene (XLPE), the terahertz frequency domain dielectric parameters and relaxation phenomena of thermal-oxidative aged XLPE are analysed using terahertz time domain spectroscopy. It is found that the real part of the terahertz dielectric constant increases with the increase of thermal-oxidative ageing duration, and the imaginary part shows an overall upward trend. Relaxation of the complex dielectric constant of the aged XLPE samples is obvious. Through the second-order Cole-Cole equation fitting, it is found that there are two relaxation processes around 0.15 and 1.5 THz, and the relaxation strength gradually increases with the ageing time. To explain this phenomena, microstructure changes and crystallisation behaviours are characterised using Fourier transform infrared spectrum and differential scanning calorimetry, respectively. It is suggested that the two relaxations may be caused by elastic dipole polarisation originating from the angular deflection of polar groups and stretching rotation of hydrogen bond. In addition, by comparing the relaxation strength in different temperatures, the source of the relaxation process is further confirmed.
引用
收藏
页码:1311 / 1321
页数:11
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