Non-destructive quality testing with photoacoustic imaging and optical coherence tomography

被引:1
作者
Park, Jeongwoo
Ahn, Joongho
Kim, Chulhong [1 ]
机构
[1] Pohang Univ Sci & Technol POSTECH, Dept Elect Engn, Convergence IT Engn, Mech Engn, Pohang 37673, South Korea
来源
HIGH-POWER LASER MATERIALS PROCESSING:APPLICATIONS, DIAGNOSTICS, AND SYSTEMS XIII | 2024年 / 12878卷
基金
新加坡国家研究基金会;
关键词
non-destructive testing; multi-modal imaging; transparent ultrasound transducer; photoacoustic imaging; optical coherence tomography;
D O I
10.1117/12.3000762
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Non-destructive testing (NDT) is vital for product safety, quality, and compliance in various industries. It enables early flaw detection, cost-effective maintenance, and customer satisfaction. NDT encompasses technologies like vision testing, radiation testing, ultrasonic testing, and magnetic testing, which are tailored to specific requirements such as environment, size, and material of the specimen. We present concurrent photoacoustic imaging (PAI) and optical coherence tomography (OCT) for non-destructive inspection of printed circuit boards (PCBs). PCBs are integral to electronic products, contributing to their miniaturization and portability. Due to the small size of RLC components within PCBs, high-resolution NDT methods are essential. PAI combines optical excitation and ultrasonic detection based on light absorption, while OCT is a purely optical imaging technique based on interference of backscattered signals. By combining PAI and OCT, we can simultaneously obtain complementary information on light absorption and scattering. However, the development of a dual-modality system combining PAI and OCT is challenging due to the opacity of conventional ultrasonic transducers. To overcome this challenge, we have developed an optically transparent ultrasound transducer for coaxial combination of PAI and OCT. Our approach successfully detects anomalies such as internal thin layer delamination and internal wire disconnection that are difficult to visually observe within PCBs, providing high-resolution PA and OCT images. In particular, unlike conventional pure optical imaging methods, PAI and OCT are depth-resolved 3D volumetric images so that internal defects can be investigated through comprehensive information in the depth direction of the sample. This dual-modality using PAI and OCT for NDT holds great promise for inspecting various specimens, including PCBs, and contributes to enhanced quality control and reliability.
引用
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页数:5
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