Effect of X-rays Irradiation on the Reliability of 850nm High-speed VCSEL

With the development of nuclear engineering and aerospace industry, the requirement for reliability of optical communication systems under a radiation environment is more and more strict. To explore the reliability of vertical-cavity surface-emitting lasers (VCSELs) in radiation environment, the photoelectric performances and lifetime of 850 nm high-speed VCSELs under X-rays irradiation are investigated. The results show that the gradual degradation of the photoelectric properties of VCSEL is caused by ionization damage. The performances of VCSEL are slightly improved under a certain dose, and the phenomenon can be explained as the radiation-induced ordering effect in crystals. Deposited energy can promote the ordering of crystals near the quantum well interface so as to compensate or even overcome the influence of ionization damage. The results of a high current accelerated life test show that the lifetime of VCSELs at the operating current is shortened with the increase in the total irradiation dose. These results provide support for the application of VCSEL and the data communication and instrument system containing VCSEL in harsh space radiation environments.