Composites single-lap joint (SLJ);
Epoxy and polyurethane adhesive;
Digital image correlation (DIC);
Backface strain (BFS);
Structural health monitoring (SHM);
FATIGUE BEHAVIOR;
EVOLUTION;
D O I:
10.1016/j.ijadhadh.2024.103791
中图分类号:
TQ [化学工业];
学科分类号:
0817 ;
摘要:
In this study, the backface strain (BFS) method applied by digital image correlation (DIC) is used to detect crack initiation and propagation in adhesively bonded single-lap joints (SLJ). By comparing the positive strain, due to the tensile load, and negative strain related to the bending moment, a point, called zero strain point (ZSP), can be detected on the substrate surface of the SLJ. Using the Bigwood and Crocombe analytical model, the presence of the ZSP on the backface is explained and the experimental results are used to detect it. The monitoring of the ZSP reveals useful information about the health condition of the joint. The main aim of this research is to investigate how the ZSP position varies by changing adhesive type (epoxy and polyurethane) and bonding area dimensions both in elastic conditions and damage progression. The results illustrate that the position of the ZSP in polyurethane SLJs is closer to the middle of the joint compared to epoxy SLJs. Additionally, the ZSP is more easily recognizable in epoxy adhesive SLJs when substrates are thicker. Finally, the ZSP showed negligible sensitivity to joint width for both types of adhesive joints regardless of the adhesive type. In conclusion, it is shown that the ZSP can be used as a monitoring index to detect damage initiation and propagation in SLJ specimens.
机构:
Fed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, BrazilFed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, Brazil
Budhe, S.
Banea, M. D.
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机构:
Fed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, BrazilFed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, Brazil
Banea, M. D.
de Barros, S.
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h-index: 0
机构:
Fed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, BrazilFed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, Brazil
de Barros, S.
da Silva, L. F. M.
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h-index: 0
机构:
Univ Porto, Fac Engn, Dept Engn Mecan, Rua Dr Roberto Frias,S-N, P-4200465 Oporto, PortugalFed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, Brazil
机构:
Fed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, BrazilFed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, Brazil
Budhe, S.
Banea, M. D.
论文数: 0引用数: 0
h-index: 0
机构:
Fed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, BrazilFed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, Brazil
Banea, M. D.
de Barros, S.
论文数: 0引用数: 0
h-index: 0
机构:
Fed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, BrazilFed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, Brazil
de Barros, S.
da Silva, L. F. M.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Porto, Fac Engn, Dept Engn Mecan, Rua Dr Roberto Frias,S-N, P-4200465 Oporto, PortugalFed Ctr Technol Educ Celso Suckow Fonseca CEFET R, Ave Maracana,229, BR-20271110 Rio De Janeiro, RJ, Brazil