Ion energy dependence of helium plasma irradiation effects on the photoelectrochemical properties of tungsten oxide

被引:0
作者
Xue, Qi [1 ]
Feng, Shuangyuan [2 ]
Kajita, Shin [1 ]
机构
[1] Univ Tokyo, Grad Sch Frontier Sci, Kashiwa, Chiba 2770882, Japan
[2] Yamaguchi Univ, Div Elect Elect & Informat Engn, Ube 7558611, Japan
基金
日本学术振兴会;
关键词
plasma; tungsten oxide; fuzz; photoelectrochemistry; THIN-FILMS; NANOSTRUCTURED TUNGSTEN; WO3; PHOTOELECTRODES; WATER OXIDATION; PHOTOANODES; ELECTROCHEMISTRY; EVOLUTION; EFFICIENT;
D O I
10.35848/1347-4065/ad78e5
中图分类号
O59 [应用物理学];
学科分类号
摘要
Tungsten samples with fuzz nanostructures on the surface were generated using helium plasma with different incident ion energies, and then fuzz tungsten oxide electrodes were prepared by calcination. The photoelectrochemical (PEC) properties and stability of the samples were measured, and the dependence on the incident ion energy was discussed. The mechanism of the fuzz structure to enhance the PEC performance of tungsten oxide was analyzed by scanning electron microscope, X-ray diffraction, and electrochemical impedance spectroscopy. The results show that the fuzzy sample fabricated with higher ion energy has greater PEC performance, which is mainly caused by the increase in active surface area.
引用
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页数:7
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