Data Generation and Augmentation Method for Deep Learning-Based VDU Leakage Signal Restoration Algorithm

被引:2
作者
Nam, Taesik [1 ]
Choi, Dong-Hoon [1 ]
Lee, Euibum [1 ]
Jo, Han-Shin [2 ]
Yook, Jong-Gwan [1 ]
机构
[1] Yonsei Univ, Dept Elect & Elect Engn, Seoul 03722, South Korea
[2] Hanyang Univ, Dept Automot Engn, Seoul 04763, South Korea
关键词
Side-channel attacks; Protocols; Monitoring; Image color analysis; Standards; Data models; Codes; TEMPEST; LCD monitor; information leakage; electromagnetic interference (EMI); compromising emanations (CE); deep learning; convolutional neural network (CNN); data augmentation; ELECTROMAGNETIC EMANATIONS; VIDEO INFORMATION;
D O I
10.1109/TIFS.2024.3393748
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
This study analyzes the phenomenon of electromagnetic (EM) leakage that occurs through cables and explores the potential for information forensics using deep learning-based image-processing algorithms. We focus on the transition-minimized differential signaling (TMDS) interface to analyze information leakage caused by the inherent differential signal synchronization errors in video graphics controllers (VGC). Our analysis includes detailed mathematical modeling of the EM leakage phenomena from the video display unit (VDU) interface that uses the TMDS protocol. Furthermore, this study presents mathematical models for distortions and alterations caused by the VDU characteristics and its associated RF front-end system. Utilizing mathematical models of EM phenomena, this paper presents a method for creating training datasets for deep learning-based signal processing algorithms by generating and augmenting pseudo leakage signals (PLS) that closely resemble actual leakage signals. This study confirms the practical utility of signal enhancement models trained with generated and augmented PLS in real-world scenarios. Validation involves applying the trained model to measured actual VDU leakage signals and evaluating the results using image quality metrics: peak signal-to-noise ratio (PSNR), signal-to-noise ratio (SNR), and the structural similarity index measure (SSIM). Ultimately, this study demonstrates the potential to develop deep learning models using theoretically generated PLS for VDU-targeted side-channel attacks, where collecting real training data poses a challenge. This suggests the potential for expanding into high-performance deep learning algorithms in future developments.
引用
收藏
页码:5220 / 5234
页数:15
相关论文
共 27 条
[1]  
[Anonymous], 2013, VESA and Industry Standards and Guidelines for Computer Display Monitor Timing(DMT), Video Electron
[2]   Reconstruction of Video Information Through Leakaged Electromagnetic Waves From Two VDUs Using a Narrow Band-Pass Filter [J].
Choi, Dong-Hoon ;
Lee, Euibum ;
Yook, Jong-Gwan .
IEEE ACCESS, 2022, 10 :40307-40315
[3]   Differential Signaling Compromises Video Information Security Through AM and FM Leakage Emissions [J].
De Meulemeester, Pieterjan ;
Scheers, Bart ;
Vandenbosch, Guy Ae .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2020, 62 (06) :2376-2385
[4]   A Quantitative Approach to Eavesdrop Video Display Systems Exploiting Multiple Electromagnetic Leakage Channels [J].
De Meulemeester, Pieterjan ;
Scheers, Bart ;
Vandenbosch, Guy A. E. .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2020, 62 (03) :663-672
[5]   Denoising of Video Frames Resulting From Video Interface Leakage Using Deep Learning for Efficient Optical Character Recognition [J].
Galvis, J. ;
Morales, S. ;
Kasmi, C. ;
Vega, F. .
IEEE LETTERS ON ELECTROMAGNETIC COMPATIBILITY PRACTICE AND APPLICATIONS, 2021, 3 (02) :82-86
[6]  
Gandolfi K., 2001, Cryptographic Hardware and Embedded Systems - CHES 2001. Third International Workshop. Proceedings (Lecture Notes in Computer Science Vol.2162), P251
[7]  
Goodfellow I, 2016, ADAPT COMPUT MACH LE, P1
[8]   Evaluation of Information Leakage from Cryptographic Hardware via Common-Mode Current [J].
Hayashi, Yu-ichi ;
Homma, Naofumi ;
Mizuki, Takaaki ;
Sugawara, Takeshi ;
Kayano, Yoshiki ;
Aoki, Takafumi ;
Minegishi, Shigeki ;
Satoh, Akashi ;
Sone, Hideaki ;
Inoue, Hiroshi .
IEICE TRANSACTIONS ON ELECTRONICS, 2012, E95C (06) :1089-1097
[9]  
Kingma Diederik P, 2014, ARXIV PREPRINT ARXIV
[10]   ImageNet Classification with Deep Convolutional Neural Networks [J].
Krizhevsky, Alex ;
Sutskever, Ilya ;
Hinton, Geoffrey E. .
COMMUNICATIONS OF THE ACM, 2017, 60 (06) :84-90