How scanning probe microscopy can be supported by artificial intelligence and quantum computing?

被引:0
作者
Pregowska, Agnieszka [1 ]
Roszkiewicz, Agata [1 ]
Osial, Magdalena [1 ]
Giersig, Michael [1 ]
机构
[1] Polish Acad Sci, Inst Fundamental Technol Res, Dept Informat & Computat Sci, Pawinskiego 5B, PL-02106 Warsaw, Poland
关键词
artificial intelligence; automated experiments; machine learning; quantum computation; scanning probe microscopy; CONVOLUTIONAL NEURAL-NETWORKS; SPATIAL-RESOLUTION; SEGMENTATION; ADSORPTION; SIMULATION; ARTIFACTS; ISOTHERM;
D O I
10.1002/jemt.24629
中图分类号
R602 [外科病理学、解剖学]; R32 [人体形态学];
学科分类号
100101 ;
摘要
The impact of Artificial Intelligence (AI) is rapidly expanding, revolutionizing both science and society. It is applied to practically all areas of life, science, and technology, including materials science, which continuously requires novel tools for effective materials characterization. One of the widely used techniques is scanning probe microscopy (SPM). SPM has fundamentally changed materials engineering, biology, and chemistry by providing tools for atomic-precision surface mapping. Despite its many advantages, it also has some drawbacks, such as long scanning times or the possibility of damaging soft-surface materials. In this paper, we focus on the potential for supporting SPM-based measurements, with an emphasis on the application of AI-based algorithms, especially Machine Learning-based algorithms, as well as quantum computing (QC). It has been found that AI can be helpful in automating experimental processes in routine operations, algorithmically searching for optimal sample regions, and elucidating structure-property relationships. Thus, it contributes to increasing the efficiency and accuracy of optical nanoscopy scanning probes. Moreover, the combination of AI-based algorithms and QC may have enormous potential to enhance the practical application of SPM. The limitations of the AI-QC-based approach were also discussed. Finally, we outline a research path for improving AI-QC-powered SPM.Research Highlights Artificial intelligence and quantum computing as support for scanning probe microscopy. The analysis indicates a research gap in the field of scanning probe microscopy. The research aims to shed light into ai-qc-powered scanning probe microscopy. This review describes the possibilities for supporting Scanning Probe Microscopy as a tool for atomic-scale materials characterization with Artificial Intelligence (AI)-based algorithms, especially Machine Learning-based algorithms and quantum computing (QC). It outlines also a research path for the improvement of AI-QC-powered Scanning Probe Microscopy. image
引用
收藏
页码:2515 / 2539
页数:25
相关论文
共 258 条
[1]   Characterization of Line Nanopatterns on Positive Photoresist Produced by Scanning Near-Field Optical Microscope [J].
Aghaei, Sadegh Mehdi ;
Yasrebi, Navid ;
Rashidian, Bizhan .
JOURNAL OF NANOMATERIALS, 2015, 2015
[2]  
alexF3, 2023, mapushunger
[3]   Automated tip functionalization via machine learning in scanning probe microscopy [J].
Alldritt, Benjamin ;
Urtev, Fedor ;
Oinonen, Niko ;
Aapro, Markus ;
Kannala, Juho ;
Liljeroth, Peter ;
Foster, Adam S. .
COMPUTER PHYSICS COMMUNICATIONS, 2022, 273
[4]   Automated structure discovery in atomic force microscopy [J].
Alldritt, Benjamin ;
Hapala, Prokop ;
Oinonena, Niko ;
Urtev, Fedor ;
Krejci, Ondrej ;
Canova, Filippo Federici ;
Kannala, Juho ;
Schulz, Fabian ;
Liljeroth, Peter ;
Foster, Adam S. .
SCIENCE ADVANCES, 2020, 6 (09)
[5]   Differentiable biology: using deep learning for biophysics-based and data-driven modeling of molecular mechanisms [J].
AlQuraishi, Mohammed ;
Sorger, Peter K. .
NATURE METHODS, 2021, 18 (10) :1169-1180
[6]   Atomic force microscopy-based indentation of cells: modelling the effect of a pericellular coat [J].
Argatov, Ivan ;
Jin, Xiaoqing ;
Mishuris, Gennady .
JOURNAL OF THE ROYAL SOCIETY INTERFACE, 2023, 20 (199)
[7]   In Situ Investigation of the Cytotoxic and Interfacial Characteristics of Titanium When Galvanically Coupled with Magnesium Using Scanning Electrochemical Microscopy [J].
Asserghine, Abdelilah ;
Ashrafi, Amir M. ;
Mukherjee, Atripan ;
Petrlak, Frantisek ;
Heger, Zbynek ;
Svec, Pavel ;
Richtera, Lukas ;
Nagy, Livia ;
Souto, Ricardo M. ;
Nagy, Geza ;
Adam, Vojtech .
ACS APPLIED MATERIALS & INTERFACES, 2021, 13 (36) :43587-43596
[8]   Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution [J].
Azib, M. ;
Baudoin, F. ;
Binaud, N. ;
Villeneuve-Faure, C. ;
Bugarin, F. ;
Segonds, S. ;
Teyssedre, G. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2018, 51 (16)
[9]   The role of convolutional neural networks in scanning probe microscopy: a review [J].
Azuri, Ido ;
Rosenhek-Goldian, Irit ;
Regev-Rudzki, Neta ;
Fantner, Georg ;
Cohen, Sidney R. .
BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2021, 12 :878-901
[10]   Measurement of polarization properties of fifth harmonic signals in apertureless-type scanning near-field optical microscopy [J].
Baba, Yuji ;
Matsuya, Iwao ;
Nishikawa, Masami ;
Ishibashi, Takayuki .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 57 (09)