Laser singulation of high refractive index glasses for augmented reality waveguides

被引:0
|
作者
Grenier, Jason R. [1 ]
Hosmer, Erin [1 ]
机构
[1] Corning Inc, 1 Riverfront Plaza, Corning, NY 14831 USA
关键词
Augmented reality; high refractive index glass; laser singulation; nanoPerforation; glass cutting; BESSEL BEAMS;
D O I
10.1117/12.3007998
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As Augmented Reality (AR) and Mixed Reality (MR) devices emerge and promise to revolutionize the way in which we perceive and interact with the world, the continued focus on the low-cost, high-volume manufacturing of the waveguides that underpin the technology is required. A significant challenge is the singulation of the high refractive index glass wafers into individual waveguides without affecting the sensitive optical components (e.g., gratings) on them. The laser nanoPerforation glass singulation process developed by Corning is well-established in multiple industrial applications and has been successfully deployed into high-volume manufacturing for AR waveguide devices. A detailed investigation into optimizing the edge strength of 0.5 mm thick Corning high refractive index glasses (n=1.7-2.0) reveals values in the range of 130-150 MPa (B-10). By applying fundamental process understanding and further optimization to Corning 0.3 mm Augmented Reality Systems (ARS) 2.0 glass, an initial demonstration of edge strength values up to 202 MPa (B-10) is realized.
引用
收藏
页数:8
相关论文
共 50 条
  • [41] Ion migration assisted inscription of high refractive index contrast waveguides by femtosecond laser pulses in phosphate glass
    Toney Fernandez, T.
    Haro-Gonzalez, P.
    Sotillo, B.
    Hernandez, M.
    Jaque, D.
    Fernandez, P.
    Domingo, C.
    Siegel, J.
    Solis, J.
    OPTICS LETTERS, 2013, 38 (24) : 5248 - 5251
  • [42] Straight and bended high refractive index rib waveguides - theoretical analysis
    Tyszkiewicz, Cuma
    12TH CONFERENCE ON INTEGRATED OPTICS: SENSORS, SENSING STRUCTURES, AND METHODS, 2017, 10455
  • [43] Strong ion migration in high refractive index contrast waveguides formed by femtosecond laser pulses in phosphate glass
    Hoyo, J.
    Sotillo, B.
    Hernandez, M.
    Toney Fernandez, T.
    Haro-Gonzalez, P.
    Jaque, D.
    Fernandez, P.
    Domingo, C.
    Siegel, J.
    Solis, J.
    LASER SOURCES AND APPLICATIONS II, 2014, 9135
  • [44] Preparation and refractive index characterization of chalcogenide glasses with gradient refractive index
    Guan, Yongnian
    Xia, Kelun
    He, Lelu
    Gu, Zhengxiang
    Liang, Yachen
    Zhang, Jingwei
    Gui, Yiming
    Wang, Xunsi
    Dai, Shixun
    Shen, Xiang
    Liu, Zijun
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2023, 106 (04) : 2288 - 2297
  • [45] Grating waveguides by machine learning for augmented reality
    Chen, Xi
    Lin, Dongfeng
    Zhang, Tao
    Zhao, Yiming
    Liu, Hongwei
    Cui, Yiping
    Hou, Chenyang
    He, Jingwen
    Liang, Sheng
    APPLIED OPTICS, 2023, 62 (11) : 2924 - 2935
  • [46] Rapid eyebox measurement for augmented reality waveguides
    Kerst, Thomas
    Bitarafan, Mohammad H.
    Jokinen, Laura
    Alasaarela, Ilkka
    Tillanen, Seppo
    Zautasvili, David
    Pachhandara, Nikhil
    APPLIED OPTICS, 2023, 62 (12) : 2998 - 3002
  • [47] Ultra-High-Refractive Index Nanocomposites for Extended Reality
    McClintock, Grace
    Tadros, Nicole Joud
    Amirmoshiri, Reza
    Guschl, Peter
    Williams, Z. Serpil Gonen
    OPTICAL ARCHITECTURES FOR DISPLAYS AND SENSING IN AUGMENTED, VIRTUAL, AND MIXED REALITY (AR, VR, MR) III, 2022, 11931
  • [48] Thermally stable high-entropy oxide glasses with high refractive index
    Zhang, Xiaoyan
    Zhang, Jinrong
    Li, Li
    Qi, Xiwei
    JOURNAL OF MATERIALS SCIENCE, 2023, 58 (31) : 12559 - 12568
  • [49] Thermally stable high-entropy oxide glasses with high refractive index
    Xiaoyan Zhang
    Jinrong Zhang
    Li Li
    Xiwei Qi
    Journal of Materials Science, 2023, 58 : 12559 - 12568
  • [50] Tailoring the nonlinear refractive index of fluoride-phosphate glasses for laser applications
    Töpfer T.
    Hein J.
    Philipps J.
    Ehrt D.
    Sauerbrey R.
    Applied Physics B, 2000, 71 (2) : 203 - 206