共 28 条
Cascading Failure Modeling for Circuit Systems Considering Continuous Degradation and Random Shocks Using an Impedance Network
被引:1
作者:

Jin, Yi
论文数: 0 引用数: 0
h-index: 0
机构:
Taizhou Univ, Sch Intelligent Manufacture, Taizhou 318000, Peoples R China Taizhou Univ, Sch Intelligent Manufacture, Taizhou 318000, Peoples R China

Zhang, Qingyuan
论文数: 0 引用数: 0
h-index: 0
机构:
Beihang Univ, Hangzhou Int Innovat Inst, Hangzhou 311115, Peoples R China Taizhou Univ, Sch Intelligent Manufacture, Taizhou 318000, Peoples R China
机构:
[1] Taizhou Univ, Sch Intelligent Manufacture, Taizhou 318000, Peoples R China
[2] Beihang Univ, Hangzhou Int Innovat Inst, Hangzhou 311115, Peoples R China
来源:
SYMMETRY-BASEL
|
2024年
/
16卷
/
04期
关键词:
cascading failure;
degradation;
random shock;
impedance network;
current redistribution factor;
COMPLEX NETWORKS;
MULTICOMPONENT SYSTEMS;
RELIABILITY-ANALYSIS;
D O I:
10.3390/sym16040488
中图分类号:
O [数理科学和化学];
P [天文学、地球科学];
Q [生物科学];
N [自然科学总论];
学科分类号:
07 ;
0710 ;
09 ;
摘要:
The reliability of circuit systems is primarily affected by cascading failures due to their complex structural and functional coupling. Causes of cascading failure during circuit operation include the continuous degradation process of components and external random shocks. Circuit systems can exhibit asymmetric structural changes and functional loss during cascading failure propagation due to the coupling of degradation and shock and their uncertainty effects. To tackle this issue, this paper abstracts the circuit into an impedance network and constructs a component failure behavior model that considers the correlation between degradation and shock. The interactions between soft and hard failure processes among different components are discussed. Two types of cascading failure propagation processes are described: slow propagation associated with continuous degradation and damage shock, and fast propagation due to fatal shock. Based on this, a cascading failure simulation algorithm is developed. This article presents a case study to demonstrate the proposed models and to analyze the reliability of a typical circuit system.
引用
收藏
页数:17
相关论文
共 28 条
- [1] Reliability analysis for k-out-of-n(G) systems subject to dependent competing failure processes[J]. COMPUTERS & INDUSTRIAL ENGINEERING, 2023, 177Bian, Lina论文数: 0 引用数: 0 h-index: 0机构: Southeast Univ, Sch Math, Nanjing 210096, Peoples R China Southeast Univ, Sch Math, Nanjing 210096, Peoples R ChinaWang, Guanjun论文数: 0 引用数: 0 h-index: 0机构: Southeast Univ, Sch Math, Nanjing 210096, Peoples R China Southeast Univ, Sch Math, Nanjing 210096, Peoples R ChinaLiu, Peng论文数: 0 引用数: 0 h-index: 0机构: Southeast Univ, Sch Math, Nanjing 210096, Peoples R China Southeast Univ, Sch Math, Nanjing 210096, Peoples R China
- [2] A novel solution for comprehensive competing failure process considering two-phase degradation and non-Poisson shock[J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 2023, 239Cao, Shihao论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R China Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R ChinaWang, Zhihua论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R China Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R ChinaLiu, Chengrui论文数: 0 引用数: 0 h-index: 0机构: Beijing Inst Control Engn, Beijing, Peoples R China Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R ChinaWu, Qiong论文数: 0 引用数: 0 h-index: 0机构: China Acad Space Technol, Inst Spacecraft Syst Engn, Beijing, Peoples R China Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R ChinaLi, Junxing论文数: 0 引用数: 0 h-index: 0机构: Henan Univ Sci & Technol, Sch Mechatron Engn, Luoyang, Peoples R China Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R ChinaOuyang, Xiangmin论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R China Beihang Univ, Sch Aeronaut Sci & Engn, Natl Key Lab Strength & Struct Integr, Beijing, Peoples R China
- [3] Overload cascading failure on complex networks with heterogeneous load redistribution[J]. PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS, 2017, 481 : 160 - 166Hou, Yueyi论文数: 0 引用数: 0 h-index: 0机构: Beijing Normal Univ, Sch Govt, Dept Management Sci, Beijing 100875, Peoples R China Beijing Normal Univ, Sch Govt, Dept Management Sci, Beijing 100875, Peoples R ChinaXing, Xiaoyun论文数: 0 引用数: 0 h-index: 0机构: Beijing Normal Univ, Sch Syst Sci, Beijing 100875, Peoples R China Beijing Normal Univ, Sch Govt, Dept Management Sci, Beijing 100875, Peoples R ChinaLi, Menghui论文数: 0 引用数: 0 h-index: 0机构: Beijing Inst Sci & Technol Intelligence, Beijing 100044, Peoples R China Beijing Normal Univ, Sch Govt, Dept Management Sci, Beijing 100875, Peoples R ChinaZeng, An论文数: 0 引用数: 0 h-index: 0机构: Beijing Normal Univ, Sch Syst Sci, Beijing 100875, Peoples R China Beijing Normal Univ, Sch Govt, Dept Management Sci, Beijing 100875, Peoples R ChinaWang, Yougui论文数: 0 引用数: 0 h-index: 0机构: Beijing Normal Univ, Sch Syst Sci, Beijing 100875, Peoples R China Beijing Normal Univ, Sch Govt, Dept Management Sci, Beijing 100875, Peoples R China
- [4] Condition-Based Maintenance Planning for Systems Subject to Dependent Soft and Hard Failures[J]. IEEE TRANSACTIONS ON RELIABILITY, 2021, 70 (04) : 1468 - 1480Hu, Jiawen论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore 117576, Singapore Natl Univ Singapore, Suzhou Res Inst, Suzhou 215123, Peoples R China Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore 117576, SingaporeSun, Qiuzhuang论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore 117576, Singapore Natl Univ Singapore, Suzhou Res Inst, Suzhou 215123, Peoples R China Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore 117576, SingaporeYe, Zhi-Sheng论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore 117576, Singapore Natl Univ Singapore, Suzhou Res Inst, Suzhou 215123, Peoples R China Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore 117576, Singapore
- [5] A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems[J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2021, 68 (10) : 10087 - 10096Jia, Zhen论文数: 0 引用数: 0 h-index: 0机构: Northwestern Polytech Univ, Sch Aeronaut, Xian 710072, Peoples R China Northwestern Polytech Univ, Sch Aeronaut, Xian 710072, Peoples R ChinaLiu, Zhenbao论文数: 0 引用数: 0 h-index: 0机构: Northwestern Polytech Univ, Sch Aeronaut, Xian 710072, Peoples R China Northwestern Polytech Univ, Sch Aeronaut, Xian 710072, Peoples R ChinaGan, Yanfen论文数: 0 引用数: 0 h-index: 0机构: Guangdong Univ Foreign Studies, South China Business Coll, Sch Informat Sci & Technol, Guangzhou 510545, Peoples R China Northwestern Polytech Univ, Sch Aeronaut, Xian 710072, Peoples R China论文数: 引用数: h-index:机构:Pecht, Michael论文数: 0 引用数: 0 h-index: 0机构: Univ Maryland, Ctr Adv Life Cycle Engn, College Pk, MD 20742 USA Northwestern Polytech Univ, Sch Aeronaut, Xian 710072, Peoples R China
- [6] Cascading failures modeling of electronic circuits with degradation using impedance network[J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 2023, 233Jin, Yi论文数: 0 引用数: 0 h-index: 0机构: Taizhou Univ, Sch Intelligent Manufacture, Jiaojiang 318000, Zhejiang, Peoples R China Taizhou Univ, Sch Intelligent Manufacture, Jiaojiang 318000, Zhejiang, Peoples R ChinaZhang, Qingyuan论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Aeronaut Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sci & Technol Reliabil & Environm Engn Lab, Beijing 100191, Peoples R China Taizhou Univ, Sch Intelligent Manufacture, Jiaojiang 318000, Zhejiang, Peoples R ChinaChen, Yunxia论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China Beihang Univ, Sci & Technol Reliabil & Environm Engn Lab, Beijing 100191, Peoples R China Taizhou Univ, Sch Intelligent Manufacture, Jiaojiang 318000, Zhejiang, Peoples R ChinaLu, Zhendan论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China Beihang Univ, Sci & Technol Reliabil & Environm Engn Lab, Beijing 100191, Peoples R China Taizhou Univ, Sch Intelligent Manufacture, Jiaojiang 318000, Zhejiang, Peoples R ChinaZu, Tianpei论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Aeronaut Sci & Engn, Beijing 100191, Peoples R China Beihang Univ, Sci & Technol Reliabil & Environm Engn Lab, Beijing 100191, Peoples R China Taizhou Univ, Sch Intelligent Manufacture, Jiaojiang 318000, Zhejiang, Peoples R China
- [7] Cascading Failure Modeling for Circuit Systems Using Impedance Networks: A Current-Flow Redistribution Approach[J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2021, 68 (01) : 632 - 641Jin, Yi论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China Taizhou Univ, Sch Aeronaut Engn, Taizhou 317000, Peoples R China Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R ChinaChen, Yunxia论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R ChinaLu, Zhendan论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R ChinaZhang, Qingyuan论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R ChinaKang, Rui论文数: 0 引用数: 0 h-index: 0机构: Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China
- [8] Reliability analysis for systems with self-healing mechanism in degradation-shock dependence processes with changing degradation rate[J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 2024, 241Kang, Fengming论文数: 0 引用数: 0 h-index: 0机构: Inner Mongolia Univ, Sch Econ & Management, Hohhot 010021, Peoples R China Inner Mongolia Univ, Sch Econ & Management, Hohhot 010021, Peoples R ChinaCui, Lirong论文数: 0 引用数: 0 h-index: 0机构: Qingdao Univ, Coll Qual & Standardizat, Qingdao 266071, Peoples R China Inner Mongolia Univ, Sch Econ & Management, Hohhot 010021, Peoples R ChinaYe, Zhisheng论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore 117576, Singapore Inner Mongolia Univ, Sch Econ & Management, Hohhot 010021, Peoples R ChinaZhou, Yu论文数: 0 引用数: 0 h-index: 0机构: Inner Mongolia Univ, Sch Econ & Management, Hohhot 010021, Peoples R China Inner Mongolia Univ, Sch Econ & Management, Hohhot 010021, Peoples R China
- [9] Stochastic load-redistribution model for cascading failure propagation[J]. PHYSICAL REVIEW E, 2010, 81 (03)Lehmann, Joerg论文数: 0 引用数: 0 h-index: 0机构: ABB Switzerland Ltd, Corp Res, CH-5405 Baden, Switzerland ABB Switzerland Ltd, Corp Res, CH-5405 Baden, SwitzerlandBernasconi, Jakob论文数: 0 引用数: 0 h-index: 0机构: ABB Switzerland Ltd, Corp Res, CH-5405 Baden, Switzerland ABB Switzerland Ltd, Corp Res, CH-5405 Baden, Switzerland
- [10] Current redistribution in resistor networks: Fat-tail statistics in regular and small-world networks[J]. PHYSICAL REVIEW E, 2017, 95 (03)Lehmann, Jorg论文数: 0 引用数: 0 h-index: 0机构: ABB Switzerland Ltd, Corp Res, Segelhofstr 1K, CH-5405 Baden, Switzerland ABB Switzerland Ltd, Corp Res, Segelhofstr 1K, CH-5405 Baden, SwitzerlandBernasconi, Jakob论文数: 0 引用数: 0 h-index: 0机构: ABB Switzerland Ltd, Corp Res, Segelhofstr 1K, CH-5405 Baden, Switzerland ABB Switzerland Ltd, Corp Res, Segelhofstr 1K, CH-5405 Baden, Switzerland