Simultaneous electromagnetic field probing system with Y-shaped separation detection structure

被引:0
作者
Li, Jianke [1 ]
Xue, Shan [1 ]
Luo, Chengyang [1 ]
Cai, Zongqi [1 ]
Chen, Yan [1 ]
Chi, Yuan [1 ,2 ]
机构
[1] China Elect Prod Reliabil & Environm Testing Inst, Natl key Lab, Guangzhou, Peoples R China
[2] China Elect Prod Reliabil & Environm Testing Inst, Guangzhou, Peoples R China
关键词
calibration; electric field measurement; electromagnetic fields; magnetic field measurement; HIGH-SENSITIVITY; HIGH-FREQUENCY; CALIBRATION; PROBES; DESIGN;
D O I
10.1049/smt2.12201
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Simultaneous electromagnetic field probing system (SEMPS) has been popular in recent years. Herein, a simultaneous electromagnetic field probing system with Y-shaped separation detection structure (SEMPS Y) is first proposed, in which the electric field probing region and the magnetic field probing region of the probe are separated by completely covering the shield along the loop and adding a pin-shaped metal wire to capture the electric field, which are not the same as the classical dual probe structure. Combined with the non-rotating asymmetric calibration method (NRACM), a 4-port vector network analyser (VNA) and a highly symmetric grounded coplanar waveguide (GCPW) calibrator are used to solve the calibration matrix of the asymmetric SEMPS Y. The high symmetry GCPW calibrator is used to generate the standard electromagnetic field for calibration. The results of standing wave measurements show that the SEMPS Y can achieve ultrawideband electromagnetic field measurement of up to 20 GHz. Based on near-field scanning measurements, SEMP Y can obtain results consistent with the calculation. In addition, when the probe is rotated 90 degrees to invalidate the H-field input, the decoupling curves of E-field and H-field are measured. Results show that the separation detection structure can effectively solve the cross-coupling problem. A novel electromagnetic field probing system, designated as the simultaneous electromagnetic field probing system with Y-shaped separation detection structure (SEMPS Y), is proposed in this study. The electric field probing region and the magnetic field probing region of the probe are separated by completely covering the shield along the loop and adding a pin-shaped metal wire to capture the electric field. Combined with the non-rotating asymmetric calibration method, a 4-port vector network analyser and a highly symmetric grounded coplanar waveguide calibrator are used to solve the calibration matrix of the asymmetric SEMPS Y. image
引用
收藏
页码:325 / 333
页数:9
相关论文
共 33 条
[1]  
[Anonymous], 2005, INTEGRATED CIRCUITSM
[2]  
[Anonymous], 2008, INTEGRATED CIRCUITSM
[3]  
[Anonymous], 2018, INTEGRATED CIRCUITSM
[4]  
[Anonymous], 2013, IEEE Standard 1309-2013 (Revision of IEEE Standard 1309-2005, P1
[5]   Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes [J].
Boyer, A. ;
Nolhier, N. ;
Caignet, F. ;
Dhia, S. Ben .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 70
[6]   Miniature electric near-field probes for measuring 3-D fields in planar microwave circuits [J].
Gao, YJ ;
Wolff, I .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1998, 46 (07) :907-913
[7]   A new miniature magnetic field probe for measuring three-dimensional fields in planar high-frequency circuits [J].
Gao, YJ ;
Wolff, I .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1996, 44 (06) :911-918
[8]   Calibration of electric coaxial near-field probes and applications [J].
Gao, YJ ;
Lauer, A ;
Ren, QM ;
Wolff, I .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1998, 46 (11) :1694-1703
[9]   An Ultrawideband Magnetic Probe With High Electric Field Suppression Ratio [J].
He, Xin ;
Li, Xiao-Chun ;
Peng, Zhi-He ;
Liu, Yu-Xu ;
Mao, Jun-Fa .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 70 :1-9
[10]   Ultrawideband Differential Magnetic Near Field Probe With High Electric Field Suppression [J].
Li, Guangwei ;
Shao, Weiheng ;
Chen, Rongquan ;
Tian, Xinxin ;
Huang, Quan ;
Zhang, Xiu Yin ;
Fang, Wenxiao ;
Chen, Yiqiang .
IEEE SENSORS JOURNAL, 2020, 20 (14) :7669-7676