The aim of the DeLLight (deflection of light by light) experiment is to observe optical nonlinearity in vacuum, as predicted by quantum electrodynamics, by measuring the refraction of a low-intensity focused laser pulse (probe) when crossing the effective vacuum index gradient induced by a high-intensity focused laser pulse (pump). The deflection signal is amplified by using a Sagnac interferometer. Here, we report a measurement performed with the DeLLight pilot interferometer, of the deflection of light by light in air, with a low-intensity pump. We show that the deflection signal measured by the interferometer is amplified, and is in agreement with the expected signal induced by the optical Kerr effect in air. Moreover, we verify that the signal varies as expected as a function of the pump intensity, the temporal delay between the pump and the probe, and their relative polarization. These results represent a proof of concept of the DeLLight experimental method based on interferometric amplification.
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Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Korea Univ, Coll Engn, Display & Nanosyst Lab, Seoul 136713, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Lee, Keunsoo
Skin, Jin-Wook
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Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, JapanElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Skin, Jin-Wook
Park, Jun-Hwan
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Pusan Natl Univ, Sch Elect Engn, Busan 609735, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Park, Jun-Hwan
Lee, Jonghee
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Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Lee, Jonghee
Joo, Chul Woong
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Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Joo, Chul Woong
Lee, Jeon-Ik
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Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Lee, Jeon-Ik
Cho, Doo-Hee
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Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Cho, Doo-Hee
Lim, Jong Tae
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Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Lim, Jong Tae
Oh, Min-Cheol
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Pusan Natl Univ, Sch Elect Engn, Busan 609735, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Oh, Min-Cheol
Ju, Byeong-Kwon
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Korea Univ, Coll Engn, Display & Nanosyst Lab, Seoul 136713, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Ju, Byeong-Kwon
Moon, Jaehyun
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Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
机构:
Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Korea Univ, Coll Engn, Display & Nanosyst Lab, Seoul 136713, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Lee, Keunsoo
Skin, Jin-Wook
论文数: 0引用数: 0
h-index: 0
机构:
Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, JapanElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Skin, Jin-Wook
Park, Jun-Hwan
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h-index: 0
机构:
Pusan Natl Univ, Sch Elect Engn, Busan 609735, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Park, Jun-Hwan
Lee, Jonghee
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h-index: 0
机构:
Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Lee, Jonghee
Joo, Chul Woong
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h-index: 0
机构:
Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Joo, Chul Woong
Lee, Jeon-Ik
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h-index: 0
机构:
Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Lee, Jeon-Ik
Cho, Doo-Hee
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h-index: 0
机构:
Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Cho, Doo-Hee
Lim, Jong Tae
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h-index: 0
机构:
Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Lim, Jong Tae
Oh, Min-Cheol
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h-index: 0
机构:
Pusan Natl Univ, Sch Elect Engn, Busan 609735, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Oh, Min-Cheol
Ju, Byeong-Kwon
论文数: 0引用数: 0
h-index: 0
机构:
Korea Univ, Coll Engn, Display & Nanosyst Lab, Seoul 136713, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea
Ju, Byeong-Kwon
Moon, Jaehyun
论文数: 0引用数: 0
h-index: 0
机构:
Elect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South KoreaElect & Telecommun Res Inst, Soft IO Interface Res Sect, Daejeon 34129, South Korea