Towards Zero-Defect Manufacturing: a review on measurement-assisted processes and their technologies

被引：4

作者：

Azamfirei, Victor ^{[1
]}

Psarommatis, Foivos ^{[2
,3
]}

Granlund, Anna ^{[1
]}

Lagrosen, Yvonne ^{[1
]}

机构：

[1] Malardalen Univ, Sch Innovat Design & Engn, Div Product Realisat, Eskilstuna, Sweden

[2] Univ Oslo, Ctr Scalable Data Access, SIRIUS, Gaustadalleen 23B, N-0373 Oslo, Norway

[3] Univ Politecn Valencia, Res Ctr Prod Engn & Management CIGIP, Valencia, Spain

来源：

5TH INTERNATIONAL CONFERENCE ON INDUSTRY 4.0 AND SMART MANUFACTURING, ISM 2023 | 2024年 / 232卷

关键词：

Zero Defect Manufacturing (ZDM); Quality Control; measurement-assisted; in-line; INSPECTION; ANALYTICS; FRAMEWORK; SYSTEM;

D O I：

10.1016/j.procs.2024.01.099

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

No system is perfect or free of errors. For companies to reach zero defects in a highly volatile and uncertain environment, emerging technologies, as well as human involvement, are needed. The tenant is to measurement-assist the manufacturing system to predict and prevent deviations in dynamic conditions. This article reviews the Measurement-assisted manufacturing (MAM) literature with the aim to (i) reveal key technologies and processes for MAM, (ii) identify current practices and their weaknesses, and (iii) propose future directions. Results show that despite MAM and Zero-Defect Manufacturing (ZDM) being treated separately, they are deeply interrelated and combining both strategies can lead to true sustainability. The literature indicated that future work must be placed in 'hardware' as instrument operation and equipment maintenance, and 'software', as data analytics and geometry assurance strategies. (c) 2023 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)

引用

页码：1001 / 1010

页数：10

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