Resolution of multiple semi-infinite delaminations using lock-in infrared thermography

被引:0
|
作者
Salazar, A. [1 ]
Sagarduy-Marcos, D. [1 ]
Rodriguez-Aseguinolaza, J. [1 ]
Mendioroz, A. [1 ]
Ciria, J. C. [2 ]
Celorrio, R. [3 ]
机构
[1] Univ Pais Vasco UPV EHU, Escuela Ingn Bilbao, Dept Fis Aplicada, Plaza Ingn Torres Quevedo 1, Bilbao 48013, Spain
[2] Univ Zaragoza, Fac Ciencias, Dept Informat Ingn & Sistemas, C-Pedro Cerbuna 12, Zaragoza 50009, Spain
[3] Univ Zaragoza, Dept Matemat Aplicada, EINA, IUMA, Edificio Torres Quevedo, Zaragoza 50018, Spain
关键词
Lock -in thermography; Delaminations; Thermal resistance; Nondestructive testing; ENHANCEMENT;
D O I
10.1016/j.ndteint.2024.103156
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Delaminations are flat subsurface defects parallel to the sample surface. Recently we have demonstrated that lock-in infrared thermography, with optical excitation, allows sizing the geometrical parameters (length, depth and thickness) of a semi-infinite delamination. Here, we analyse the ability of this technique to resolve several parallel and semi-infinite delaminations. First, we develop an analytical method (based on the thermal quadrupoles) together with a numerical formulation to calculate the surface temperature of a sample containing several semi-infinite parallel delaminations. We verify that both methods provide the same temperature values, indicating their consistency. Then, we study the ability of lock-in infrared thermography to resolve two close delaminations. In particular we focus on two main configurations: two non-overshadowed delaminations and two superimposed delaminations. Next, after analysing the inverse problem in terms of residual function minimization, we develop a dedicated parametric estimation procedure able to retrieve the geometry of the studied defects. Finally, we test this procedure with synthetic temperature amplitude and phase data to retrieve the geometrical parameters of both delaminations.
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页数:9
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