Estimation of alpha exposure on CR-39 detector using a UV-VIS spectrophotometer

被引：0
作者：
Alameri, H. [1 ]
Abou-Ali, Y. [1 ]
Obeid, M. H. [2 ]
Shweikani, R. [2 ]
机构：
[1] Univ Damascus, Fac Sci, Dept Phys, POB 30621, Damascus, Syria
[2] Atom Energy Commiss, Prod & Safety Dept, POB 6091, Damascus, Syria
来源：
APPLIED RADIATION AND ISOTOPES | 2024年 / 209卷
关键词：
CR-39; detectors; Alpha tracks; Transmittance; UV-VIS spectrophotometer; TRACKS; PARAMETERS;
D O I：
10.1016/j.apradiso.2024.111331
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
This work is dedicated to study the possibility of using UV-VIS spectrophotometer, a non-invasive technique with a versatile applications that is being used to determine the optical properties of matter, to estimate the CR-39 exposure to alpha particles. CR-39 detectors were exposed to alpha particles from two different alpha sources: 241Am and radon gas. Tracks densities on CR-39 were determined using the traditional counting method by an optical microscope. The transmittances of CR-39 detectors were measured using UV-VIS spectroscopy in the range of 400-1000 nm, and results were correlated with measured tracks densities. The comparison showed that this method is effective in estimating exposure of CR-39 to alpha particles, and that its efficiency has increased by increasing the etching time of the detectors.
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页数：5
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